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  2. Microsecond Bus - Wikipedia

    en.wikipedia.org/wiki/Microsecond_Bus

    MSC signalling scheme: fast downstream (TTL = red, TTL or LVDS = yellow), slow upstream (TLL = green) The Microsecond Bus, μSB or MSB is an asymmetric serial communication interface specification for short-distance communication between a master and multiple slaves.

  3. Failure of electronic components - Wikipedia

    en.wikipedia.org/wiki/Failure_of_electronic...

    In semiconductor devices, problems in the device package may cause failures due to contamination, mechanical stress of the device, or open or short circuits. Failures most commonly occur near the beginning and near the ending of the lifetime of the parts, resulting in the bathtub curve graph of failure rates.

  4. Cross section (electronics) - Wikipedia

    en.wikipedia.org/wiki/Cross_section_(electronics)

    In electronics, a cross section, cross-section, or microsection, is a prepared electronics sample that allows analysis at a plane that cuts through the sample.It is a destructive technique requiring that a portion of the sample be cut or ground away to expose the internal plane for analysis.

  5. Automotive electronics - Wikipedia

    en.wikipedia.org/wiki/Automotive_electronics

    The earliest electronic systems available as factory installations were vacuum tube car radios, starting in the early 1930s.The development of semiconductors after World War II greatly expanded the use of electronics in automobiles, with solid-state diodes making the automotive alternator the standard after about 1960, and the first transistorized ignition systems appearing in 1963.

  6. Reliability (semiconductor) - Wikipedia

    en.wikipedia.org/wiki/Reliability_(semiconductor)

    Reliability of a semiconductor device is the ability of the device to perform its intended function during the life of the device in the field. There are multiple considerations that need to be accounted for when developing reliable semiconductor devices: Semiconductor devices are very sensitive to impurities and particles. Therefore, to ...

  7. Negative-bias temperature instability - Wikipedia

    en.wikipedia.org/wiki/Negative-bias_temperature...

    More specifically, over time positive charges become trapped at the oxide-semiconductor boundary underneath the gate of a MOSFET. These positive charges partially cancel the negative gate voltage without contributing to conduction through the channel as electron holes in the semiconductor are supposed to. When the gate voltage is removed, the ...

  8. Semiconductor supply chain problems are ‘going to take a long ...

    www.aol.com/finance/semiconductor-supply-chain...

    While the short-term problems will ease, the permanent solution is to “make more semiconductors in America,” Raimondo said. In 1990, the U.S. controlled nearly 40% of the world’s ...

  9. Hot-carrier injection - Wikipedia

    en.wikipedia.org/wiki/Hot-carrier_injection

    The term "hot electron" comes from the effective temperature term used when modelling carrier density (i.e., with a Fermi-Dirac function) and does not refer to the bulk temperature of the semiconductor (which can be physically cold, although the warmer it is, the higher the population of hot electrons it will contain all else being equal).

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