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The characterization technique optical microscopy showing the micron scale dendritic microstructure of a bronze alloy. Characterization, when used in materials science, refers to the broad and general process by which a material's structure and properties are probed and measured. It is a fundamental process in the field of materials science ...
The characterization of mechanical properties in polymers typically refers to a measure of the strength, elasticity, viscoelasticity, and anisotropy of a polymeric material. The mechanical properties of a polymer are strongly dependent upon the Van der Waals interactions of the polymer chains, and the ability of the chains to elongate and align ...
Short title: Optical characterization in microelectronics manufacturing: Image title: To successfully construct semiconductor devices, the semiconductor industry must measure fundamental material parameters, especially when developing new materials; measure the quality of the material as it is grown; accurately determine the details of thin films, quantum wells, and other microstructures that ...
Besides material characterization, the material scientist or engineer also deals with extracting materials and converting them into useful forms. Thus ingot casting, foundry methods, blast furnace extraction, and electrolytic extraction are all part of the required knowledge of a materials engineer. Often the presence, absence, or variation of ...
Solid-state chemistry, also sometimes referred as materials chemistry, is the study of the synthesis, structure, and properties of solid phase materials.It therefore has a strong overlap with solid-state physics, mineralogy, crystallography, ceramics, metallurgy, thermodynamics, materials science and electronics with a focus on the synthesis of novel materials and their characterization.
Dynamic mechanical analysis (abbreviated DMA) is a technique used to study and characterize materials.It is most useful for studying the viscoelastic behavior of polymers.A sinusoidal stress is applied and the strain in the material is measured, allowing one to determine the complex modulus.
Powder diffraction is a scientific technique using X-ray, neutron, or electron diffraction on powder or microcrystalline samples for structural characterization of materials. [2] An instrument dedicated to performing such powder measurements is called a powder diffractometer .
Semiconductor characterization techniques are used to characterize a semiconductor material or device (p–n junction, Schottky diode, solar cell, etc.).Some examples of semiconductor properties that could be characterized include the depletion width, carrier concentration, carrier generation and recombination rates, carrier lifetimes, defect concentration, and trap states.