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The probe is the spherical part, 50 mm in diameter and made from titanium with a surface coating of titanium nitride. A Langmuir probe is a device used to determine the electron temperature, electron density, and electric potential of a plasma. It works by inserting one or more electrodes into a plasma, with a constant or time-varying electric ...
Figure 1. Waveguide slotted line. Slotted lines are used for microwave measurements and consist of a movable probe inserted into a slot in a transmission line.They are used in conjunction with a microwave power source and usually, in keeping with their low-cost application, a low cost Schottky diode detector and VSWR meter rather than an expensive microwave power meter.
Typical passive oscilloscope probe being used to test an integrated circuit. A test probe is a physical device used to connect electronic test equipment to a device under test (DUT). Test probes range from very simple, robust devices to complex probes that are sophisticated, expensive, and fragile.
High-precision laboratory measurements of electrical quantities are used in experiments to determine fundamental physical properties such as the charge of the electron or the speed of light, and in the definition of the units for electrical measurements, with precision in some cases on the order of a few parts per million. Less precise ...
Four-point measurement of resistance between voltage sense connections 2 and 3. Current is supplied via force connections 1 and 4. In electrical engineering, four-terminal sensing (4T sensing), 4-wire sensing, or 4-point probes method is an electrical impedance measuring technique that uses separate pairs of current-carrying and voltage-sensing electrodes to make more accurate measurements ...
An electrical drawing is a type of technical drawing that shows information about power, lighting, and communication for an engineering or architectural project.Any electrical working drawing consists of "lines, symbols, dimensions, and notations to accurately convey an engineering's design to the workers, who install the electrical system on the job".
Depending on the machine, the probe position may be manually controlled by an operator, or it may be computer controlled. CMMs (coordinate-measuring machine) specify a probe's position in terms of its displacement from a reference position in a three-dimensional Cartesian coordinate system (i.e., with XYZ axes). In addition to moving the probe ...
Probe cards are broadly classified into needle type, vertical type, and MEMS (Micro Electro-Mechanical System) [4] type depending on shape and forms of contact elements. MEMS type is the most advanced technology currently available. The most advanced type of probe card currently can test an entire 12" wafer with one touchdown.