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  2. Test probe - Wikipedia

    en.wikipedia.org/wiki/Test_probe

    Typical passive oscilloscope probe being used to test an integrated circuit. A test probe is a physical device used to connect electronic test equipment to a device under test (DUT). Test probes range from very simple, robust devices to complex probes that are sophisticated, expensive, and fragile.

  3. Pitot–static system - Wikipedia

    en.wikipedia.org/wiki/Pitot–static_system

    Airspeed indicator diagram showing pressure sources from both the pitot tube and the static port The pitot–static system obtains pressures for interpretation by the pitot–static instruments. While the explanations below explain traditional, mechanical instruments, many modern aircraft use an air data computer (ADC) to calculate airspeed ...

  4. Thermocouple - Wikipedia

    en.wikipedia.org/wiki/Thermocouple

    The magnitude of the voltage depends on the types of wire being used. Generally, the voltage is in the microvolt range and care must be taken to obtain a usable measurement. Although very little current flows, power can be generated by a single thermocouple junction. Power generation using multiple thermocouples, as in a thermopile, is common.

  5. Four-terminal sensing - Wikipedia

    en.wikipedia.org/wiki/Four-terminal_sensing

    Four-point measurement of resistance between voltage sense connections 2 and 3. Current is supplied via force connections 1 and 4. In electrical engineering, four-terminal sensing (4T sensing), 4-wire sensing, or 4-point probes method is an electrical impedance measuring technique that uses separate pairs of current-carrying and voltage-sensing electrodes to make more accurate measurements ...

  6. Eddy-current testing - Wikipedia

    en.wikipedia.org/wiki/Eddy-current_testing

    Tubing inspection is generally limited to non-ferromagnetic tubing and is known as conventional eddy current testing. Conventional ECT is used for inspecting steam generator tubing in nuclear plants and heat exchangers tubing in power and petrochemical industries. The technique is very sensitive to detect and size pits.

  7. EU Chips Act 2.0 should include legacy chips, says industry ...

    www.aol.com/news/eu-chips-act-2-0-102740385.html

    The European Commission should expand plans to strengthen its computer chip sector to include "foundational and legacy" semiconductors, where much of the region's strengths lie, the head of ...

  8. Probe card - Wikipedia

    en.wikipedia.org/wiki/Probe_card

    Probe cards are broadly classified into needle type, vertical type, and MEMS (Micro Electro-Mechanical System) [4] type depending on shape and forms of contact elements. MEMS type is the most advanced technology currently available. The most advanced type of probe card currently can test an entire 12" wafer with one touchdown.

  9. Hyundai recalls over 225,000 cars for faulty rearview camera ...

    www.aol.com/hyundai-recalls-over-225-000...

    Hyundai is recalling more than 225,000 vehicles over concerns of a rearview camera failing.. Six different vehicles from the Santa Fe and Elantra model lines are covered under the recall submitted ...