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  2. Test point - Wikipedia

    en.wikipedia.org/wiki/Test_point

    A test point is a location within an electronic circuit that is used to either monitor the state of the circuitry or to inject test signals. [1]

  3. Huawei Y6p - Wikipedia

    en.wikipedia.org/wiki/Huawei_Y6p

    The Huawei Y6p is equipped with EMUI 10.1 which is based on the Android 10 operating system. Due to the ongoing United States sanctions against Huawei, the models of the Y6p did not ship with, or support, Google Mobile Services—the proprietary software suite (including Google Play-branded software) shipped on certified Android devices.

  4. List of Huawei phones - Wikipedia

    en.wikipedia.org/wiki/List_of_Huawei_phones

    Y6p: 32/64 GB 3/4 GB 13 MP (wide) 5 MP (ultrawide) 2 MP (depth) 8 MP 5000 mAh Y8s Kirin 710 64/128 GB 4 GB 48 MP (wide) 2 MP (depth) 8 MP (wide) 2 MP (depth) 4000 mAh Y8p Kirin 710F 128 GB 4/6 GB 48 MP (wide) 8 MP (ultrawide) 2 MP (depth) 16 MP Y9a (also known as Nova Y9a) September 2020 MediaTek Helio G80 128 GB 6/8 GB

  5. Transmission level point - Wikipedia

    en.wikipedia.org/wiki/Transmission_level_point

    In telecommunications, a transmission level point (TLP) is a test point in an electronic circuit that is typically a transmission channel. At the TLP, a test signal may be introduced or measured. [1] Various parameters, such as the power of the signal, noise, voltage levels, wave forms, may be measured at the TLP. [2]

  6. Device under test - Wikipedia

    en.wikipedia.org/wiki/Device_under_test

    A device under test (DUT), also known as equipment under test (EUT) and unit under test (UUT), is a manufactured product undergoing testing, either at first manufacture or later during its life cycle as part of ongoing functional testing and calibration checks.

  7. Qualcomm EDL mode - Wikipedia

    en.wikipedia.org/wiki/Qualcomm_EDL_mode

    Screenshot of Device Manager, containing a Qualcomm device booted in the Emergency Download Mode. The Qualcomm Emergency Download mode, commonly known as Qualcomm EDL mode and officially known as Qualcomm HS-USB QD-Loader 9008 [1] is a feature implemented in the boot ROM of a system on a chip by Qualcomm which can be used to recover bricked smartphones.

  8. Breakout box - Wikipedia

    en.wikipedia.org/wiki/Breakout_box

    T1000-37 Tesuto Breakout box employing commonly used 37 position D-sub connectors that break out to banana jack test points. A four-port serial (RS-232) PCI Express ×1 expansion card with an octopus cable that breaks the card's DC-37 connector into four standard DE-9 connectors Example of a pocket-sized RS-232 breakout box that features switches to reconfigure or patch any or all the active ...

  9. In-circuit testing - Wikipedia

    en.wikipedia.org/wiki/In-circuit_testing

    A common form of in-circuit testing uses a bed-of-nails tester.This is a fixture that uses an array of spring-loaded pins known as "pogo pins". When a printed circuit board is aligned with and pressed down onto the bed-of-nails tester, the pins make electrical contact with locations on the circuit board, allowing them to be used as test points for in-circuit testing.