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  2. Comparison of S.M.A.R.T. tools - Wikipedia

    en.wikipedia.org/wiki/Comparison_of_S.M.A.R.T._tools

    Also shows temperature of CPU, GPU, CPU core speed, Intel Turbo Boost status, CPU power consumption, system load and system fan speeds. Can control speed of GPU and system fans. CrystalDiskInfo: Windows: MIT GUI IDE(PATA), SATA, NVMe eSATA, USB, IEEE 1394: Several RAID controllers [4] Yes No Mail, sound and popup Sister utility to ...

  3. Built-in self-test - Wikipedia

    en.wikipedia.org/wiki/Built-in_self-test

    Then, a periodic test will assure that the device has not become unsafe since the POST. Safety-critical devices normally define a "safety interval", a period of time too short for injury to occur. The self test of the most critical functions normally is completed at least once per safety interval. The periodic test is normally a subset of the POST.

  4. Hardware stress test - Wikipedia

    en.wikipedia.org/wiki/Hardware_stress_test

    A stress test (sometimes called a torture test) of hardware is a form of deliberately intense and thorough testing used to determine the stability of a given system or entity. It involves testing beyond normal operational capacity , often to a breaking point, in order to observe the results.

  5. Power-on self-test - Wikipedia

    en.wikipedia.org/wiki/Power-on_self-test

    A power-on self-test (POST) is a process performed by firmware or software routines immediately after a computer or other digital electronic device is powered on. [ 1 ] POST processes may set the initial state of the device from firmware and detect if any hardware components are non-functional.

  6. Dielectric withstand test - Wikipedia

    en.wikipedia.org/wiki/Dielectric_withstand_test

    An insulation test set; in this pattern, a hand-cranked generator provides the high voltage and the scale is directly calibrated in megohms. Voltage withstand testing is done with a high-voltage source and voltage and current meters. A single instrument called a "pressure test set" or "hipot tester" is often used to perform this test.

  7. Short-circuit test - Wikipedia

    en.wikipedia.org/wiki/Short-circuit_test

    Currents during such events can be several times the normal rated current. The resultant forces can distort the windings or break internal connections. For large utility-scale power transformers, high-power test laboratories have facilities to apply the very high power levels representative of a fault on an interconnected grid system.

  8. Design for testing - Wikipedia

    en.wikipedia.org/wiki/Design_for_testing

    The most common method for delivering test data from chip inputs to internal circuits under test (CUTs, for short), and observing their outputs, is called scan-design. In scan-design, registers ( flip-flops or latches) in the design are connected in one or more scan chains , which are used to gain access to internal nodes of the chip.

  9. Open-circuit test - Wikipedia

    en.wikipedia.org/wiki/Open-circuit_test

    The open-circuit test, or no-load test, is one of the methods used in electrical engineering to determine the no-load impedance in the excitation branch of a transformer. The no load is represented by the open circuit, which is represented on the right side of the figure as the "hole" or incomplete part of the circuit.