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On the Evaluation of Unsupervised Outlier Detection: Measures, Datasets, and an Empirical Study Most data files are adapted from UCI Machine Learning Repository data, some are collected from the literature. treated for missing values, numerical attributes only, different percentages of anomalies, labels 1000+ files ARFF: Anomaly detection
Semi-supervised anomaly detection techniques assume that some portion of the data is labelled. This may be any combination of the normal or anomalous data, but more often than not, the techniques construct a model representing normal behavior from a given normal training data set, and then test the likelihood of a test instance to be generated ...
A training data set is a data set of examples used during the learning process and is used to fit the parameters (e.g., weights) of, for example, a classifier. [9] [10]For classification tasks, a supervised learning algorithm looks at the training data set to determine, or learn, the optimal combinations of variables that will generate a good predictive model. [11]
Self-GenomeNet is an example of self-supervised learning in genomics. [18] Self-supervised learning continues to gain prominence as a new approach across diverse fields. Its ability to leverage unlabeled data effectively opens new possibilities for advancement in machine learning, especially in data-driven application domains.
In anomaly detection, the local outlier factor (LOF) is an algorithm proposed by Markus M. Breunig, Hans-Peter Kriegel, Raymond T. Ng and Jörg Sander in 2000 for finding anomalous data points by measuring the local deviation of a given data point with respect to its neighbours.
OPTICS-OF [5] is an outlier detection algorithm based on OPTICS. The main use is the extraction of outliers from an existing run of OPTICS at low cost compared to using a different outlier detection method. The better known version LOF is based on the same concepts.
A Tsetlin machine is a form of learning automaton collective for learning patterns using propositional logic. Ole-Christoffer Granmo created [1] and gave the method its name after Michael Lvovitch Tsetlin, who invented the Tsetlin automaton [2] and worked on Tsetlin automata collectives and games. [3]
The term one-class classification (OCC) was coined by Moya & Hush (1996) [8] and many applications can be found in scientific literature, for example outlier detection, anomaly detection, novelty detection. A feature of OCC is that it uses only sample points from the assigned class, so that a representative sampling is not strictly required for ...