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  2. Nanoparticle - Wikipedia

    en.wikipedia.org/wiki/Nanoparticle

    A nanoparticle or ultrafine particle is a particle of matter 1 to 100 nanometres (nm) in diameter. [1][2] The term is sometimes used for larger particles, up to 500 nm, or fibers and tubes that are less than 100 nm in only two directions. [2]: 394 At the lowest range, metal particles smaller than 1 nm are usually called atom clusters instead.

  3. Copper nanoparticle - Wikipedia

    en.wikipedia.org/wiki/Copper_nanoparticle

    A copper nanoparticle is a copper based particle 1 to 100 nm in size. [1] Like many other forms of nanoparticles, a copper nanoparticle can be prepared by natural processes or through chemical synthesis. [2] These nanoparticles are of particular interest due to their historical application as coloring agents and the biomedical as well as the ...

  4. Scanning electron microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_electron_microscope

    M. von Ardenne's. A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample.

  5. High-resolution transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/High-resolution...

    High-resolution image of magnesium sample. High-resolution transmission electron microscopy is an imaging mode of specialized transmission electron microscopes that allows for direct imaging of the atomic structure of samples. [1][2] It is a powerful tool to study properties of materials on the atomic scale, such as semiconductors, metals ...

  6. Atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Atomic_force_microscopy

    A disadvantage of AFM compared with the scanning electron microscope (SEM) is the single scan image size. In one pass, the SEM can image an area on the order of square millimeters with a depth of field on the order of millimeters, whereas the AFM can only image a maximum scanning area of about 150×150 micrometers and a maximum height on the ...

  7. Field-emission microscopy - Wikipedia

    en.wikipedia.org/wiki/Field-emission_microscopy

    Field-emission microscopy. Field-emission microscopy (FEM) is an analytical technique that is used in materials science to study the surfaces of needle apexes. [1][2] The FEM was invented by Erwin Wilhelm Müller in 1936, [3] and it was one of the first surface-analysis instruments that could approach near- atomic resolution.

  8. 4D scanning transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/4D_scanning_transmission...

    4D scanning transmission electron microscopy (4D STEM) is a subset of scanning transmission electron microscopy (STEM) which utilizes a pixelated electron detector to capture a convergent beam electron diffraction (CBED) pattern at each scan location. This technique captures a 2 dimensional reciprocal space image associated with each scan point ...

  9. Nanomaterials - Wikipedia

    en.wikipedia.org/wiki/Nanomaterials

    In ISO/TS 80004, nanomaterial is defined as the "material with any external dimension in the nanoscale or having internal structure or surface structure in the nanoscale", with nanoscale defined as the "length range approximately from 1 nm to 100 nm". This includes both nano-objects, which are discrete pieces of material, and nanostructured ...