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XRD may refer to: X-ray diffraction , used to study the structure, composition, and physical properties of materials Extensible Resource Descriptor , an XML format for discovery of metadata about a web resource
X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering , when there is no change in the energy of the waves.
IRC—Internet Relay Chat; IrDA—Infrared Data Association; IRI—Internationalized Resource Identifier; IRP—I/O Request Packet; IRQ—Interrupt Request; IS—Information Systems; IS-IS—Intermediate System to Intermediate System; ISA—Industry Standard Architecture; ISA—Instruction Set Architecture; ISAM—Indexed Sequential Access Method
Lee was inspired to launch a messaging and chat app in the wake of the disaster and his NHN Japan team was testing a beta version of an app accessible on smartphones, tablet and PC, which would work on data network and provide continuous and free instant messaging and calling service, [20] within two months.
Comparison of user features of messaging platforms refers to a comparison of all the various user features of various electronic instant messaging platforms. This includes a wide variety of resources; it includes standalone apps, platforms within websites, computer software, and various internal functions available on specific devices, such as iMessage for iPhones.
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X-ray diffraction (XRD) is still the most used method for structural analysis of chemical compounds. Yet, with increasing detail on the relation of K β {\displaystyle K_{\beta }} -line spectra and the surrounding chemical environment of the ionized metal atom, measurements of the so-called valence-to-core (V2C) energy region become ...
X-ray diffraction computed tomography is an experimental technique that combines X-ray diffraction with the computed tomography data acquisition approach. X-ray diffraction (XRD) computed tomography (CT) was first introduced in 1987 by Harding et al. [ 1 ] using a laboratory diffractometer and a monochromatic X-ray pencil beam .