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2. Scanning electron microscope - Wikipedia

   en.wikipedia.org/wiki/Scanning_electron_microscope

   An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...

3. High-resolution transmission electron microscopy - Wikipedia

   en.wikipedia.org/wiki/High-resolution...

   High-resolution transmission electron microscopy is an imaging mode of specialized transmission electron microscopes that allows for direct imaging of the atomic structure of samples. [ 1 ] [ 2 ] It is a powerful tool to study properties of materials on the atomic scale, such as semiconductors, metals, nanoparticles and sp 2 -bonded carbon (e.g ...

4. Electron microscope - Wikipedia

   en.wikipedia.org/wiki/Electron_microscope

   A transmission electron microscope from 2002 An image of an ant in a scanning electron microscope An electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope to control the electron beam, for instance focusing ...

5. Scanning transmission electron microscopy - Wikipedia

   en.wikipedia.org/wiki/Scanning_transmission...

   A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused ...

6. Transmission electron microscopy - Wikipedia

   en.wikipedia.org/wiki/Transmission_electron...

   Scanning electron microscope image of a thin TEM sample milled by FIB. The thin membrane shown here is suitable for TEM examination; however, at ~300-nm thickness, it would not be suitable for high-resolution TEM without further milling. More recently focused ion beam methods have been used to prepare samples. FIB is a relatively new technique ...

7. 4D scanning transmission electron microscopy - Wikipedia

   en.wikipedia.org/wiki/4D_scanning_transmission...

   4D scanning transmission electron microscopy (4D STEM) is a subset of scanning transmission electron microscopy (STEM) which utilizes a pixelated electron detector to capture a convergent beam electron diffraction (CBED) pattern at each scan location. This technique captures a 2 dimensional reciprocal space image associated with each scan point ...

8. The best microscope photos of 2022 reveal a hidden world of ...

   www.aol.com/news/best-microscope-photos-2022...

   Nikon's Small World competition recognizes the best microscope photographs of the year.. Microscopy is an art and a science, revealing the alien beauty of the hidden world all around us. The 2022 ...

9. Serial block-face scanning electron microscopy - Wikipedia

   en.wikipedia.org/wiki/Serial_block-face_scanning...

   Serial block-face scanning electron microscopy is a method to generate high resolution three-dimensional images from small samples. The technique was developed for brain tissue, but it is widely applicable for any biological samples. [ 1 ]