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  2. Probe card - Wikipedia

    en.wikipedia.org/wiki/Probe_card

    A semiconductor manufacturer will typically require a new probe card for each new device wafer and for device shrinks (when the manufacturer reduces the size of the device while keeping its functionality) because the probe card is effectively a custom connector that takes the universal pattern of a given tester and translates the signals to ...

  3. Technoprobe - Wikipedia

    en.wikipedia.org/wiki/Technoprobe

    Technoprobe was founded in Merate near Milan in 1996 by Giuseppe Crippa, who had developed a new and more rapid method to manufacture probe cards. [2] In 2007, Technoprobe marketed the first probe card with vertical MEMS. [3] By 2017, it was the world's third largest manufacturer of probe cards, [4] and by 2020, it was second largest. [2] [5] [6]

  4. Non-contact wafer testing - Wikipedia

    en.wikipedia.org/wiki/Non-contact_wafer_testing

    the probe card may be damaged from repeated contact, or become contaminated with debris created by contact with the wafer [2] the probe will act as a circuit and affect the results of the test. For this reason, the tests performed at wafer sort cannot always be identical and as extensive as those performed at the final device test after ...

  5. FormFactor (FORM) Boosts Probe Card Efforts With New Facility

    www.aol.com/news/formfactor-form-boosts-probe...

    FormFactor (FORM) announces the opening of a new probe card manufacturing facility in Livermore, CA, in a bid to bolster its presence in the United States.

  6. Wafer testing - Wikipedia

    en.wikipedia.org/wiki/Wafer_testing

    Wafer testing is a step performed during semiconductor device fabrication after back end of line (BEOL) and before IC packaging.. Two types of testing are typically done. Very basic wafer parametric tests (WPT) are performed at a few locations on each wafer to ensure the wafer fabrication process has been carried out successfully.

  7. Automatic test equipment - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_equipment

    Semiconductor ATE, named for testing semiconductor devices, can test a wide range of electronic devices and systems, from simple components (resistors, capacitors, and inductors) to integrated circuits (ICs), printed circuit boards (PCBs), and complex, completely assembled electronic systems. For this purpose, probe cards are used. ATE systems ...

  8. FormFactor, Inc. - Wikipedia

    en.wikipedia.org/wiki/FormFactor,_Inc.

    [17] [18] In July 2020, Advantest Corporation's probe card assets were acquired by FormFactor for $35 million [19] [20] and in October, it acquired High Precision Devices, Inc. (HPD). [21] [22] An additional manufacturing facility was opened in Livermore in 2021, to expand the existing and provide an additional 90,000 square feet of facility ...

  9. Catholic League blasts Whitmer for mocking Eucharist

    www.aol.com/catholic-league-blasts-whitmer...

    The Catholic League criticized Michigan Gov. Gretchen Whitmer (D) on Friday for posting a video showing her feeding a Dorito to a podcaster, with the group accusing her of mocking the Eucharist.

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