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  2. Probe card - Wikipedia

    en.wikipedia.org/wiki/Probe_card

    Probe cards are broadly classified into needle type, vertical type, and MEMS (Micro Electro-Mechanical System) [4] type depending on shape and forms of contact elements. MEMS type is the most advanced technology currently available. The most advanced type of probe card currently can test an entire 12" wafer with one touchdown.

  3. Non-contact wafer testing - Wikipedia

    en.wikipedia.org/wiki/Non-contact_wafer_testing

    the probe card may be damaged from repeated contact, or become contaminated with debris created by contact with the wafer [2] the probe will act as a circuit and affect the results of the test. For this reason, the tests performed at wafer sort cannot always be identical and as extensive as those performed at the final device test after ...

  4. Wafer testing - Wikipedia

    en.wikipedia.org/wiki/Wafer_testing

    Wafer testing is a step performed during semiconductor device fabrication after back end of line (BEOL) and before IC packaging.. Two types of testing are typically done. Very basic wafer parametric tests (WPT) are performed at a few locations on each wafer to ensure the wafer fabrication process has been carried out successfully.

  5. Stay Cool With One of These Editor-Approved Cantilever Umbrellas

    www.aol.com/lifestyle/best-cantilever-umbrellas...

    8-Foot Square Cantilever Umbrella. For anyone with minimal outdoor space or a sunny backyard, this eight-foot-wide umbrella is a smart choice. The yarn-dyed polyester canopy is water-repellant and ...

  6. Add Ample Shade to Your Backyard With These Designer ... - AOL

    www.aol.com/lifestyle/best-cantilever-umbrellas...

    10' x 13' Rectangular Cantilever Patio Umbrella. If you're looking for a non-circular canopy shape, Morse recommends an option like this one. It has a single wind vent and comes in your choice of ...

  7. Technoprobe - Wikipedia

    en.wikipedia.org/wiki/Technoprobe

    Technoprobe was founded in Merate near Milan in 1996 by Giuseppe Crippa, who had developed a new and more rapid method to manufacture probe cards. [2] As the company grew, it opened manufacturing and sales offices abroad, including in Rousset, France (2001), Singapore (2003), San Jose, California (2007), Philippines (2010), Korea (2015), and Japan (2018).

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