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Durex is a British brand of condoms and personal lubricants owned by Reckitt Benckiser and currently led by Ben Wilson. [1] It was initially developed in London under the purview of the London Rubber Company and British Latex Products Ltd, where it was manufactured between 1932 and 1994.
Chiffon—6 to 8 mm (can be made in double thickness, i.e. 12 to 16 mm) Crepe de Chine—12 to 16 mm; Gauze—3 to 5 mm; Raw silk—35 to 40 mm (heavier silks appear more "wooly") Organza—4 to 6 mm; Charmeuse—12 to 30 mm; The higher the weight in mommes, the more durable the weave and the more suitable it is for heavy-duty use.
The ability to gauge thickness measurement without requiring access to both sides of the test piece, offers this technology a multitude of possible applications. Paint thickness gauges, ultrasonic coating thickness gauges, digital thickness gauges and many more options are available to test plastics, glass, ceramics, metal and other materials.
New developments continued to occur in the condom market, with the first polyurethane condom—branded Avanti and produced by the manufacturer of Durex—introduced in the 1990s. [102]: 32–5 Worldwide condom use is expected to continue to grow: one study predicted that developing nations would need 18.6 billion condoms by 2015.
The two sub-problems are coupled through the load carried by the lubricant and by the “dry” contact. In its simplest approximation, the lubrication sub-problem can be represented via a central film thickness fit [14] to calculate the film thickness and the Greenwood-Williamson model [15] for the “dry” contact sub-problem. This approach ...
Assessments will be used to calculate loan amounts. Once the amounts are determined, the governing board of local governments will be required to vote on acceptance. Money could flow in three ...
Thickness of the Ge 40 Se 60 /Si film on the silicon substrate as 34.5 nm, Thickness of the Ge 40 Se 60 /Si film on the oxidized silicon substrate as 33.6 nm, Thickness of SiO 2 (with n and k spectra of SiO 2 held fixed), and; n and k spectra, in 190–1000 nm range, of Ge 40 Se 60 /Si.
Thin-film thickness monitors, deposition rate controllers, and so on, are a family of instruments used in high and ultra-high vacuum systems. They can measure the thickness of a thin film, not only after it has been made, but while it is still being deposited, and some can control either the final thickness of the film, the rate at which it is deposited, or both.