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  2. Osmium - Wikipedia

    en.wikipedia.org/wiki/Osmium

    Osmium (from Ancient Greek ὀσμή (osmḗ) 'smell') is a chemical element; it has symbol Os and atomic number 76. It is a hard, brittle, bluish-white transition metal in the platinum group that is found as a trace element in alloys, mostly in platinum ores. Osmium is the densest naturally occurring element.

  3. Test light - Wikipedia

    en.wikipedia.org/wiki/Test_light

    A test light, test lamp, voltage tester, or mains tester is a piece of electronic test equipment used to determine the presence of electricity in a piece of equipment under test. A test light is simpler and less costly than a measuring instrument such as a multimeter , and often suffices for checking for the presence of voltage on a conductor.

  4. Air flow meter - Wikipedia

    en.wikipedia.org/wiki/Air_flow_meter

    An air flow meter is a device similar to an anemometer that measures air flow, i.e. how much air is flowing through a tube. It does not measure the volume of the air passing through the tube, it measures the mass of air flowing through the device per unit time, though Thus air flow meters are simply an application of mass flow meters for the ...

  5. Electronic test equipment - Wikipedia

    en.wikipedia.org/wiki/Electronic_test_equipment

    Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

  6. Osmium compounds - Wikipedia

    en.wikipedia.org/wiki/Osmium_compounds

    Osmium(I) iodide is a metallic grey solid produced by the reaction of osmium tetroxide and hydroiodic acid heated in a water bath for 48 hours in a carbon dioxide atmosphere. It is an amorphous compound. [34] Osmium(II) iodide is a black solid [35] produced by the reaction of osmium tetroxide and hydroiodic acid at 250 °C in nitrogen: [34]

  7. Design for testing - Wikipedia

    en.wikipedia.org/wiki/Design_for_testing

    One benefit of the Structural paradigm is that test generation can focus on testing a limited number of relatively simple circuit elements rather than having to deal with an exponentially exploding multiplicity of functional states and state transitions. While the task of testing a single logic gate at a time sounds simple, there is an obstacle ...

  8. In-circuit testing - Wikipedia

    en.wikipedia.org/wiki/In-circuit_testing

    A common form of in-circuit testing uses a bed-of-nails tester.This is a fixture that uses an array of spring-loaded pins known as "pogo pins". When a printed circuit board is aligned with and pressed down onto the bed-of-nails tester, the pins make electrical contact with locations on the circuit board, allowing them to be used as test points for in-circuit testing.

  9. Eddy-current testing - Wikipedia

    en.wikipedia.org/wiki/Eddy-current_testing

    Eddy current testing (ECT) as a technique for testing finds its roots in electromagnetism. Eddy currents were first observed by François Arago in 1824, but French physicist Léon Foucault is credited with discovering them in 1855. ECT began largely as a result of the English scientist Michael Faraday's discovery of electromagnetic induction in ...

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