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Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms ) to the surface under study, the probe is then raster scanned across the surface, the image is then ...
AFM has also been used to measure, in an aqueous environment, the dispersion force due to polymer adsorbed on the substrate. [17] Forces of the order of a few piconewtons can now be routinely measured with a vertical distance resolution of better than 0.1 nanometers. Force spectroscopy can be performed with either static or dynamic modes.
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California’s economy is regarded as fairly healthy, but in some ways it still lags the nation. Unemployment last month was 5.3%, tied for the nation’s second highest behind Nevada. The ...
The instrumentation involved for pc-AFM is very similar to that necessary for traditional AFM or the modified conductive AFM. The main difference between pc-AFM and other types of AFM instruments is the illumination source that is focused through the inverted microscope objective and the neutral density filter that is positioned adjacent to the illumination source.
Some of the worst-performing elementary schools in California retrained teachers to teach reading with phonics. A new paper says the change worked.
Electrochemical AFM (EC-AFM) is a particular type of Scanning probe microscopy (SPM), which combines the classical Atomic force microscopy (AFM) together with electrochemical measurements. EC-AFM allows to perform in-situ AFM measurements in an electrochemical cell , in order to investigate the actual changes in the electrode surface morphology ...