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Download as PDF; Printable version; In other projects ... This category contains articles about the different types of scanning probe microscopes and methods ...
Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). [ 1 ] [ 2 ] [ 3 ] By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features.
Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope , an instrument for imaging surfaces at the atomic level.
Scanning Hall probe microscope (SHPM) is a variety of a scanning probe microscope which incorporates accurate sample approach and positioning of the scanning tunnelling microscope with a semiconductor Hall sensor. Developed in 1996 by Oral, Bending and Henini, [2] SHPM allows mapping the magnetic induction associated with a sample.
It has long scan times for large sample areas for high resolution imaging. [citation needed] An additional limitation is the predominant orientation of the polarization state of the interrogating light in the near-field of the scanning tip. Metallic scanning tips naturally orient the polarization state perpendicular to the sample surface.
Scanning probe lithography [1] (SPL) describes a set of nanolithographic methods to pattern material on the nanoscale using scanning probes. It is a direct-write, mask-less approach which bypasses the diffraction limit and can reach resolutions below 10 nm. [ 2 ]
Scanning vibrating electrode technique was originally introduced to sensitively measure extracellular currents by Jaffe and Nuccitelli in 1974. [1] Jaffe and Nuccitelli then demonstrated the ability of the technique through the measurement of the extracellular currents involved with amputated and re-generating newt limbs, [5] developmental currents of chick embryos, [6] and the electrical ...
Several new microscopy techniques with a sub-nanometer resolution have been developed in the last several decades, such as electron microscopy (SEM and TEM) and scanning probe microscopy (NSOM, STM and AFM). SPM differs from other techniques in that the excitation and signal collection are very close (less than diffraction limit distance) to ...