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  2. Rietveld refinement - Wikipedia

    en.wikipedia.org/wiki/Rietveld_refinement

    Rietveld refinement is a technique described by Hugo Rietveld for use in the characterisation of crystalline materials. The neutron and X-ray diffraction of powder samples results in a pattern characterised by reflections (peaks in intensity) at certain positions. The height, width and position of these reflections can be used to determine many ...

  3. Scherrer equation - Wikipedia

    en.wikipedia.org/wiki/Scherrer_Equation

    The Scherrer equation, in X-ray diffraction and crystallography, is a formula that relates the size of sub-micrometre crystallites in a solid to the broadening of a peak in a diffraction pattern. It is often referred to, incorrectly, as a formula for particle size measurement or analysis.

  4. Income–consumption curve - Wikipedia

    en.wikipedia.org/wiki/Income–consumption_curve

    In figure 3, the income–consumption curve bends back on itself as with an increase income, the consumer demands more of X 2 and less of X 1. [3] The income–consumption curve in this case is negatively sloped and the income elasticity of demand will be negative. [4] Also the price effect for X 2 is positive, while it is negative for X 1. [3]

  5. Income elasticity of demand - Wikipedia

    en.wikipedia.org/wiki/Income_elasticity_of_demand

    A positive income elasticity of demand is associated with normal goods; an increase in income will lead to a rise in quantity demanded. If income elasticity of demand of a commodity is less than 1, it is a necessity good. If the elasticity of demand is greater than 1, it is a luxury good or a superior good.

  6. X-ray diffraction - Wikipedia

    en.wikipedia.org/wiki/X-ray_diffraction

    The resulting map of the directions of the X-rays far from the sample is called a diffraction pattern. It is different from X-ray crystallography which exploits X-ray diffraction to determine the arrangement of atoms in materials, and also has other components such as ways to map from experimental diffraction measurements to the positions of atoms.

  7. XRD - Wikipedia

    en.wikipedia.org/wiki/XRD

    XRD may refer to: X-ray diffraction , used to study the structure, composition, and physical properties of materials Extensible Resource Descriptor , an XML format for discovery of metadata about a web resource

  8. Wide-angle X-ray scattering - Wikipedia

    en.wikipedia.org/wiki/Wide-angle_X-ray_scattering

    It is an X-ray-diffraction [2] method and commonly used to determine a range of information about crystalline materials. The term WAXS is commonly used in polymer sciences to differentiate it from SAXS but many scientists doing "WAXS" would describe the measurements as Bragg/X-ray/powder diffraction or crystallography.

  9. Profit maximization - Wikipedia

    en.wikipedia.org/wiki/Profit_maximization

    In simple terms, although profit is related to total cost, =, the enterprise can maximize profit by producing to the maximum profit (the maximum value of ) to maximize profit. But when the total cost increases, it does not mean maximizing profit Will change, because the increase in total cost does not necessarily change the marginal cost.