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Automatic item generation (AIG), or automated item generation, is a process linking psychometrics with computer programming. It uses a computer algorithm to automatically create test items that are the basic building blocks of a psychological test. The method was first described by John R. Bormuth [1] in the 1960s but was not developed until ...
Computer-based test interpretation (CBTI) programs are technological tools that have been commonly used to interpret data in psychological assessments since the 1960s. CBTI programs are used for a myriad of psychological tests, like clinical interviews or problem rating, but are most frequently exercised in psychological and neuropsychological ...
The Cambridge Neuropsychological Test Automated Battery (CANTAB), [1] originally developed at the University of Cambridge in the 1980s but now provided in a commercial capacity by Cambridge Cognition, is a computer-based cognitive assessment system consisting of a battery of neuropsychological tests, administered to subjects using a touch screen computer.
Test automation, mostly using unit testing, is a key feature of extreme programming and agile software development, where it is known as test-driven development (TDD) or test-first development. Unit tests can be written to define the functionality before the code is written.
ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.
Automated DNA sequencing was a disruptive technology when it became practical and -even if early devices had shortcomings- it enabled genome scale sequencing projects and created the field of bioinformatics. The impact of a similarly disruptive and powerful technology on molecular cell biology and translational research is hard to predict but ...
Automatic test equipment diagnostics is the part of an ATE test that determines the faulty components. ATE tests perform two basic functions. The first is to test whether or not the Device Under Test is working correctly. The second is when the DUT is not working correctly, to diagnose the reason.
The pre-testing effect, also known as errorful generation or pre-questioning, is a related but distinct category where testing material before the material has been learned appears to lead to better subsequent learning performance than would have been the case without the pre-test, provided that feedback is given as to the correct answers once ...