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  2. Design for testing - Wikipedia

    en.wikipedia.org/wiki/Design_for_testing

    While the task of testing a single logic gate at a time sounds simple, there is an obstacle to overcome. For today's highly complex designs, most gates are deeply embedded whereas the test equipment is only connected to the primary Input/outputs (I/Os) and/or some physical test points. The embedded gates, hence, must be manipulated through ...

  3. Automatic test pattern generation - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_pattern...

    ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.

  4. Integrated circuit design - Wikipedia

    en.wikipedia.org/wiki/Integrated_circuit_design

    Digital design focuses on logical correctness, maximizing circuit density, and placing circuits so that clock and timing signals are routed efficiently. Analog IC design also has specializations in power IC design and RF IC design. Analog IC design is used in the design of op-amps, linear regulators, phase locked loops, oscillators and active ...

  5. Test engineer - Wikipedia

    en.wikipedia.org/wiki/Test_engineer

    Depending on the product, the machines that we are referring to could mean a combination of Automatic Test Equipment (ATE), handler, interface board, and test program that drives the ATE, as with the case of the IC chip testing. Test automation is a big part of a test engineer's job. The whole intention of automating the test is as follows:

  6. JTAG - Wikipedia

    en.wikipedia.org/wiki/JTAG

    JTAG (named after the Joint Test Action Group which codified it) is an industry standard for verifying designs of and testing printed circuit boards after manufacture. JTAG implements standards for on-chip instrumentation in electronic design automation (EDA) as a complementary tool to digital simulation . [ 1 ]

  7. Device under test - Wikipedia

    en.wikipedia.org/wiki/Device_under_test

    In semiconductor testing, the device under test is a die on a wafer or the resulting packaged part. A connection system is used, connecting the part to automatic or manual test equipment. The test equipment then applies power to the part, supplies stimulus signals, then measures and evaluates the resulting outputs from the device.

  8. Semiconductor device modeling - Wikipedia

    en.wikipedia.org/wiki/Semiconductor_device_modeling

    Electronic Design Automation For Integrated Circuits Handbook, by Lavagno, Martin, and Scheffer, ISBN 0-8493-3096-3 A survey of the field of electronic design automation. This summary was derived (with permission) from Vol II, Chapter 25, Device Modeling—from physics to electrical parameter extraction , by Robert W. Dutton, Chang-Hoon Choi ...

  9. Electronic system-level design and verification - Wikipedia

    en.wikipedia.org/wiki/Electronic_system-level...

    The basic premise is to model the behavior of the entire system using a low-level language such as C, C++, or using graphical "model-based" design tools. Newer languages are emerging that enable the creation of a model at a higher level of abstraction including general purpose system design languages like SysML as well as those that are ...