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Established in 1991 and originally published by Wiley, it was transferred to its subsidiary Hindawi in 2023, adopting an open access model. The journal was previously known as International Journal of Microwave and Millimeter-Wave Computer-Aided Engineering until 1998. [1] [2]
The Hoboken, New Jersey, headquarters. The company was established in 1807 when Charles Wiley opened a print shop in Manhattan.The company was the publisher of 19th century American literary figures like James Fenimore Cooper, Washington Irving, Herman Melville, and Edgar Allan Poe, as well as of legal, religious, and other non-fiction titles.
The Hindawi Publishing Corporation was founded in 1997 in Cairo by Ahmed Hindawi and his wife Nagwa Abdel-Mottaleb. [11] [12] [13] The company's first journal was the International Journal of Mathematics and Mathematical Sciences, which it acquired from a prior publisher. By 2006 Hindawi Publishing owned 48 journals and had about 220 employees.
Pages in category "Hindawi Publishing Corporation academic journals" The following 200 pages are in this category, out of approximately 336 total. This list may not reflect recent changes .
It was established in 1978 by Lokenath Debnath and is published by the Hindawi Publishing Corporation. The journal publishes articles in all areas of mathematics such as pure and applied mathematics, mathematical physics, theoretical mechanics, probability and mathematical statistics, and theoretical biology.
Abstract and Applied Analysis; Active and Passive Electronic Components; Adsorption Science and Technology; Advances in Acoustics and Vibration; Advances in Agriculture
once an article is published, the preprint should link to the published version (typically via DOI) the preprint should not have been formally peer reviewed; Publishers may place additional restrictions (e.g. specifying non-commercial servers or preferred licenses).
SCANNING: The Journal of Scanning Microscopies is a peer-reviewed scientific journal covering all aspects of scanning microscopy, including scanning electron, scanning probe and scanning optical microscopies. [1]