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  2. Leakage (electronics) - Wikipedia

    en.wikipedia.org/wiki/Leakage_(electronics)

    In electronics, leakage is the gradual transfer of electrical energy across a boundary normally viewed as insulating, such as the spontaneous discharge of a charged capacitor, magnetic coupling of a transformer with other components, or flow of current across a transistor in the "off" state or a reverse-polarized diode.

  3. Subthreshold conduction - Wikipedia

    en.wikipedia.org/wiki/Subthreshold_conduction

    Subthreshold leakage in an nFET. Subthreshold conduction or subthreshold leakage or subthreshold drain current is the current between the source and drain of a MOSFET when the transistor is in subthreshold region, or weak-inversion region, that is, for gate-to-source voltages below the threshold voltage.

  4. 1N4148 signal diode - Wikipedia

    en.wikipedia.org/wiki/1N4148_signal_diode

    They can be used interchangeably, and are cross-reference replacements for each other. They differed mainly in their leakage current specification, however, today most manufacturers list common specifications. For example, Vishay lists the same leakage current for both parts: [6] [7] 25 nA at -20 V, 25°C; 5 μA at -75 V, 25°C; 50 μA at -20 V ...

  5. Silicon controlled rectifier - Wikipedia

    en.wikipedia.org/wiki/Silicon_controlled_rectifier

    The device behaves as two diodes connected in series. A small leakage current flows. This is the reverse blocking mode. If the reverse voltage is increased, then at critical breakdown level, called the reverse breakdown voltage (V BR), an avalanche occurs at J1 and J3 and the reverse current increases rapidly. SCRs are available with reverse ...

  6. Diode - Wikipedia

    en.wikipedia.org/wiki/Diode

    There is also a tiny surface leakage current caused by electrons simply going around the diode as though it were an imperfect insulator. Semi-log I–V (logarithmic current vs. linear voltage) graph of various diodes. Forward biased: The current–voltage curve is exponential, approximating the Shockley diode equation.

  7. Iddq testing - Wikipedia

    en.wikipedia.org/wiki/Iddq_testing

    The current consumed in the state is commonly called Iddq for Idd (quiescent) and hence the name. Iddq testing uses the principle that in a correctly operating quiescent CMOS digital circuit , there is no static current path between the power supply and ground, except for a small amount of leakage.

  8. Multi-channel length - Wikipedia

    en.wikipedia.org/wiki/Multi-channel_length

    Multi-channel length is a technique for reducing power leakage in both active and idle modes on CMOS technology.Other techniques to reduce leakage, like power gating and SRAM retention, are targeted at reducing leakage power when the device, or portions of it, are not operating.

  9. Glitch removal - Wikipedia

    en.wikipedia.org/wiki/Glitch_removal

    Shum, Warren; Anderson, Jason H. (2011), FPGA Glitch Power Analysis and Reduction, International Symposium on Low power electronics and design (ISLPED), pp. 27– 32 Zhanping, Chen; Liqiong, Wei; Kaushik, Roy (March 1997), Reducing Glitching and Leakage Power in Low Voltage CMOS Circuits , Purdue University School of Electrical and Computer ...