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X-ray absorption spectroscopy (XAS) is a widely used technique for determining the local geometric and/or electronic structure of matter. [1] The experiment is usually performed at synchrotron radiation facilities, which provide intense and tunable X-ray beams. Samples can be in the gas phase, solutions, or solids. [2]
In geometry, a nonagon (/ ˈ n ɒ n ə ɡ ɒ n /) or enneagon (/ ˈ ɛ n i ə ɡ ɒ n /) is a nine-sided polygon or 9-gon. The name nonagon is a prefix hybrid formation , from Latin ( nonus , "ninth" + gonon ), used equivalently, attested already in the 16th century in French nonogone and in English from the 17th century.
The X-ray absorption coefficient of a material as a function of energy is obtained by directing X-rays of a narrow energy range at a sample, while recording the incident and transmitted x-ray intensity, as the incident x-ray energy is incremented.
X-ray absorption near edge structure (XANES), also known as near edge X-ray absorption fine structure (NEXAFS), is a type of absorption spectroscopy that indicates the features in the X-ray absorption spectra of condensed matter due to the photoabsorption cross section for electronic transitions from an atomic core level to final states in the energy region of 50–100 eV above the selected ...
X-ray diffraction is a non destructive method of characterization of solid materials. When X-rays are directed at solids they scatter in predictable patterns based on the internal structure of the solid. A crystalline solid consists of regularly spaced atoms (electrons) that can be described by imaginary planes.
X-ray emission spectroscopy (XES) is a form of X-ray spectroscopy in which a core electron is excited by an incident x-ray photon and then this excited state decays by emitting an x-ray photon to fill the core hole. The energy of the emitted photon is the energy difference between the involved electronic levels.
RIXS is bulk sensitive: the penetration depth of resonant X-ray photons depends on the material and on the scattering geometry, but typically is of the order of a few micrometers in the hard X-rays regime (for example at transition metal K-edges) and on the order of 0.1 micrometers in the soft X-ray regime (e.g. transition metal L-edges). [1 ...
The incident beam strikes the sample under a small angle close to the critical angle of total external x-ray reflection. The intense reflected beam as well as the intense scattering in the incident plane are attenuated by a rod-shaped beam stop. The diffuse scattering from the sample (red arrow) is recorded with an area detector.