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The conventionally used aid in cable fault testing and location is the cable test van. The van is installed with conventional cable measuring systems for quickly reaching the location of any cable fault. In 20 years that followed, over 2000 fault location vehicles were manufactured, more than half of which were intended for the former USSR.
The Murray loop bridge is a bridge circuit used for locating faults in underground or underwater cables. [1] [2] It has been used for more than 100 years [3] but is being replaced by the more precise time-domain reflectometer. One end of the faulted cable is connected through a pair of resistors to the voltage source.
Time-domain reflectometer for cable fault detection. A time-domain reflectometer (TDR) is an electronic instrument used to determine the characteristics of electrical lines by observing reflected pulses.
A "thumper" test set applies a high-energy, high-voltage pulse to the cable. Fault location is done by listening for the sound of the discharge at the fault. While this test contributes to damage at the cable site, it is practical because the faulted location would have to be re-insulated when found in any case. [7]
A time-domain reflectometer; an instrument used to locate the position of faults on lines from the time taken for a reflected wave to return from the discontinuity.. A signal travelling along an electrical transmission line will be partly, or wholly, reflected back in the opposite direction when the travelling signal encounters a discontinuity in the characteristic impedance of the line, or if ...
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Multistation watt-hour meter test board 1942 Resistive load box 1950 Cable fault locator 1951 Protective relay test set 1953 Partial discharge (Corona) detection system 1968 Portable digital multimeter 1979 Digital line earth loop impedance tester 1985 Microprocessor-based high current test set 1989 Battery impedance test equipment (BITE) 1990
The on-test failure rates on a cable system are in the range of 0.2 to 4% for 30 min tests performed at the IEEE 400.2 voltage levels. IEEE Std. 400.2 provides suggested time and voltage test levels but exact parameters are not possible since defect growth rates are not known and can vary widely.