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Fleiss' kappa is a generalisation of Scott's pi statistic, [2] a statistical measure of inter-rater reliability. [3] It is also related to Cohen's kappa statistic and Youden's J statistic which may be more appropriate in certain instances. [4]
There are two techniques used for operational testing to test the reliability of software: Steady state reliability estimation In this case, we use feedback from delivered software products. Depending on those results, we can predict the future reliability for the next version of product. This is similar to sample testing for physical products.
Unfortunately, there is no way to directly observe or calculate the true score, so a variety of methods are used to estimate the reliability of a test. Some examples of the methods to estimate reliability include test-retest reliability, internal consistency reliability, and parallel-test reliability. Each method comes at the problem of ...
In statistics, inter-rater reliability (also called by various similar names, such as inter-rater agreement, inter-rater concordance, inter-observer reliability, inter-coder reliability, and so on) is the degree of agreement among independent observers who rate, code, or assess the same phenomenon.
Cohen's kappa measures the agreement between two raters who each classify N items into C mutually exclusive categories. The definition of is =, where p o is the relative observed agreement among raters, and p e is the hypothetical probability of chance agreement, using the observed data to calculate the probabilities of each observer randomly selecting each category.
The item-reliability index (IRI) is defined as the product of the point-biserial item-total correlation and the item standard deviation. In classical test theory, the IRI indexes the degree to which an item contributes true score variance to the exam observed score variance. In practice, a negative IRI indicates the relative degree which an ...
High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test stresses the IC at an elevated temperature, high voltage and dynamic operation for a predefined period of time. The IC is usually monitored under stress and tested at intermediate intervals.
Kendall's W (also known as Kendall's coefficient of concordance) is a non-parametric statistic for rank correlation.It is a normalization of the statistic of the Friedman test, and can be used for assessing agreement among raters and in particular inter-rater reliability.