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Product lifetimes can be modelled using extant data from surveys with the application of probability and other statistical concepts (e.g. distributions). [12] [22] One of the earliest attempts to estimate product lifetimes was undertaken by Pennock and Jaeger [23] who utilised actuarial methods to measure the Service life of household goods for ...
Given a component database calibrated with field failure data that is reasonably accurate, [1] the method can predict device level failure rate per failure mode, useful life, automatic diagnostic effectiveness, and latent fault test effectiveness for a given application.
Government and commercial failure rate data Handbooks of failure rate data for various components are available from government and commercial sources. MIL-HDBK-217F, Reliability Prediction of Electronic Equipment, is a military standard that provides failure rate data for many military electronic components. Several failure rate data sources ...
High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test stresses the IC at an elevated temperature, high voltage and dynamic operation for a predefined period of time. The IC is usually monitored under stress and tested at intermediate intervals.
The circuit's EVA and RSS results are determined for beginning-of-life and end-of-life states. These results are used to calculate part stresses and are applied to other analysis. In order for the WCCA to be useful throughout the product’s life cycle, it is extremely important that the analysis be documented in a clear and concise format.
In the later life of the product, the failure rate increases due to wearout. Many electronic consumer product life cycles follow the bathtub curve. [ 1 ] It is difficult to know where a product is along the bathtub curve, or even if the bathtub curve is applicable to a certain product without large amounts of products in use and associated ...
The difference between service life and predicted life is most clear when considering mission time and reliability in comparison to MTBF and service life. For example, a missile system can have a mission time of less than one minute, service life of 20 years, active MTBF of 20 minutes, dormant MTBF of 50 years, and reliability of 99.9999%.
Applications such as aerospace systems, life support systems, telecommunications, railway signals, and computers use great numbers of individual electronic components. Analysis of the statistical properties of failures can give guidance in designs to establish a given level of reliability.