Search results
Results from the WOW.Com Content Network
Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. A FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM).
Cells must be identified and targeted with a high degree of accuracy. This can be accomplished using cell staining and fluorescence microscopy or without staining through the use of techniques such as quantitative phase microscopy or phase contrast microscopy. Ultimately, the objective is to recognize cells, target them, and move them into ...
Electron-beam-induced deposition (EBID) is a process of decomposing gaseous molecules by an electron beam leading to deposition of non-volatile fragments onto a nearby substrate. The electron beam is usually provided by a scanning electron microscope , which results in high spatial accuracy (potentially below one nanometer) and the possibility ...
IBA – Ion beam analysis; IBIC – Ion beam induced charge microscopy; ICP-AES – Inductively coupled plasma atomic emission spectroscopy; ICP-MS – Inductively coupled plasma mass spectrometry; Immunofluorescence; ICR – Ion cyclotron resonance; IETS – Inelastic electron tunneling spectroscopy; IGA – Intelligent gravimetric analysis
A small ion beam rocket being tested by NASA. An ion beam is a beam of ions, a type of charged particle beam. Ion beams have many uses in electronics manufacturing (principally ion implantation) and other industries. There are many ion beam sources, some derived from the mercury vapor thrusters developed by NASA in the 1960s. The most widely ...
Focused ion and electron beam techniques for the fabrication of strong, stable, reproducible Si 3 N 4 pyramidal tips with 1.0 μm length and 0.1 μm diameter were reported by Russell in 1992. [6] Significant advancement also came through the introduction of micro-fabrication methods for the creation of precise conical or pyramidal silicon and ...
Ion-beam lithography, or ion-projection lithography, is similar to Electron beam lithography, but uses much heavier charged particles, ions. In addition to diffraction being negligible, ions move in straighter paths than electrons do both through vacuum and through matter, so there seems be a potential for very high resolution.
Ion beam analysis works on the basis that ion-atom interactions are produced by the introduction of ions to the sample being tested. Major interactions result in the emission of products that enable information regarding the number, type, distribution and structural arrangement of atoms to be collected.