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A stress test (sometimes called a torture test) of hardware is a form of deliberately intense and thorough testing used to determine the stability of a given system or entity. It involves testing beyond normal operational capacity , often to a breaking point, in order to observe the results.
A stress test (sometimes called a torture test) of hardware is a form of deliberately intense and thorough testing used to determine the stability of a given system or entity. It involves testing beyond normal operational capacity , often to a breaking point, in order to observe the results.
The stress test can result in three outcomes: Pass, Partly Pass and Fail, based on the comparison of the quantified risks to acceptable risk exposure levels and a penalty system. Phase 3: Decision, during which the results of the stress test are analyzed according to the goal and objectives defined in Phase 1. Critical events (events that most ...
Stress testing usually consists of testing beyond specified limits in order to determine failure points and test failure recovery. [ 1 ] [ 2 ] Load testing implies a controlled environment moving from low loads to high.
Environmental stress screening (ESS) refers to the process of exposing a newly manufactured or repaired product or component (typically electronic) to stresses such as thermal cycling and vibration in order to force latent defects to manifest themselves by permanent or catastrophic failure during the screening process. The surviving population ...
Stress testing is normally used to understand the upper limits of capacity within the system. This kind of test is done to determine the system's robustness in terms of extreme load and helps application administrators to determine if the system will perform sufficiently if the current load goes well above the expected maximum.
A highly accelerated life test (HALT) is a stress testing methodology for enhancing product reliability in which prototypes are stressed to a much higher degree than expected from actual use in order to identify weaknesses in the design or manufacture of the product. [1]
High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test stresses the IC at an elevated temperature, high voltage and dynamic operation for a predefined period of time. The IC is usually monitored under stress and tested at intermediate intervals.