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  2. Hardware stress test - Wikipedia

    en.wikipedia.org/wiki/Hardware_stress_test

    A stress test (sometimes called a torture test) of hardware is a form of deliberately intense and thorough testing used to determine the stability of a given system or entity. It involves testing beyond normal operational capacity , often to a breaking point, in order to observe the results.

  3. Stress testing (computing) - Wikipedia

    en.wikipedia.org/wiki/Stress_testing_(computing)

    A stress test (sometimes called a torture test) of hardware is a form of deliberately intense and thorough testing used to determine the stability of a given system or entity. It involves testing beyond normal operational capacity , often to a breaking point, in order to observe the results.

  4. Inquisitor (hardware testing software) - Wikipedia

    en.wikipedia.org/wiki/Inquisitor_(hardware...

    Inquisitor is a software suite used for hardware diagnostics, stress testing, certification and benchmarking platform. It is available in three formats: It is available in three formats: Standalone – As a package to be installed into existing Linux installation; such practice is somewhat limited in available tests.

  5. Stress testing - Wikipedia

    en.wikipedia.org/wiki/Stress_testing

    The goal and objectives, the time frame, the stress test level and the total costs of the stress test are defined. Phase 2: Assessment, during which the stress test at the component and the system scope is performed, including fragility [12] and risk [13] analysis of the CIs for the stressors defined in Phase 1. The stress test can result in ...

  6. Design for testing - Wikipedia

    en.wikipedia.org/wiki/Design_for_testing

    The most common method for delivering test data from chip inputs to internal circuits under test (CUTs, for short), and observing their outputs, is called scan-design. In scan design, registers ( flip-flops or latches) in the design are connected in one or more scan chains , which are used to gain access to internal nodes of the chip.

  7. Device under test - Wikipedia

    en.wikipedia.org/wiki/Device_under_test

    In semiconductor testing, the device under test is a die on a wafer or the resulting packaged part. A connection system is used, connecting the part to automatic or manual test equipment. The test equipment then applies power to the part, supplies stimulus signals, then measures and evaluates the resulting outputs from the device.

  8. Load testing - Wikipedia

    en.wikipedia.org/wiki/Load_testing

    The governing contract, technical specification or test method contains the details of conducting the test. The purpose of a mechanical load test is to verify that all the component parts of a structure including materials, base-fixings are fit for task and loading it is designed for. Several types of load testing are employed

  9. Smoke testing (electrical) - Wikipedia

    en.wikipedia.org/wiki/Smoke_testing_(electrical)

    In Lessons Learned in Software Testing, Cem Kaner, James Bach, and Brett Pettichord provided the origin of the term: "The phrase smoke test comes from electronic hardware testing. You plug in a new board and turn on the power. If you see smoke coming from the board, turn off the power. You don't have to do any more testing." [2]