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  2. X-ray diffraction - Wikipedia

    en.wikipedia.org/wiki/X-ray_diffraction

    X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering , when there is no change in the energy of the waves.

  3. X-ray crystallography - Wikipedia

    en.wikipedia.org/wiki/X-ray_crystallography

    A powder X-ray diffractometer in motion. X-ray crystallography is the experimental science of determining the atomic and molecular structure of a crystal, in which the crystalline structure causes a beam of incident X-rays to diffract in specific directions.

  4. R-factor (crystallography) - Wikipedia

    en.wikipedia.org/wiki/R-factor_(crystallography)

    In crystallography, the R-factor (sometimes called residual factor or reliability factor or the R-value or R Work) is a measure of the disagreement between the crystallographic model and the experimental X-ray diffraction data - lower the R value lower is the disagreement or

  5. Diffractometer - Wikipedia

    en.wikipedia.org/wiki/Diffractometer

    The detector end of a simple x-ray diffractometer with an area detector. The direction of the X-rays is indicated with the red arrow. A typical diffractometer consists of a source of radiation, a monochromator to choose the wavelength, slits to adjust the shape of the beam, a sample and a detector.

  6. Crystallography - Wikipedia

    en.wikipedia.org/wiki/Crystallography

    The first X-ray diffraction experiment was conducted in 1912 by Max von Laue, [7] while electron diffraction was first realized in 1927 in the Davisson–Germer experiment [8] and parallel work by George Paget Thomson and Alexander Reid. [9] These developed into the two main branches of crystallography, X-ray crystallography and electron ...

  7. X-ray scattering techniques - Wikipedia

    en.wikipedia.org/wiki/X-ray_scattering_techniques

    This is an X-ray diffraction pattern formed when X-rays are focused on a crystalline material, in this case a protein. Each dot, called a reflection, forms from the coherent interference of scattered X-rays passing through the crystal.

  8. Direct methods (electron microscopy) - Wikipedia

    en.wikipedia.org/wiki/Direct_methods_(electron...

    One of the reasons direct methods was originally developed for analyzing X-ray diffraction is because almost all X-ray diffraction is kinematical. While most electron diffraction is dynamical, which is more difficult to interpret, there are instances in which mostly kinematical scattering intensities can be measured. One specific example is ...

  9. XRD - Wikipedia

    en.wikipedia.org/wiki/XRD

    XRD may refer to: X-ray diffraction , used to study the structure, composition, and physical properties of materials Extensible Resource Descriptor , an XML format for discovery of metadata about a web resource