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In electronics, a cross section, cross-section, or microsection, is a prepared electronics sample that allows analysis at a plane that cuts through the sample.It is a destructive technique requiring that a portion of the sample be cut or ground away to expose the internal plane for analysis.
An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...
However, unlike CTEM, in STEM the electron beam is focused to a fine spot (with the typical spot size 0.05 – 0.2 nm) which is then scanned over the sample in a raster illumination system constructed so that the sample is illuminated at each point with the beam parallel to the optical axis.
The transducer is mounted on the z-axis of the SAM. It can be focused to a specific target layer located in a hard-to-access area by changing the z-position with respect to the sample under testing that is mechanically fixed. [6] The B-scan provides a vertical cross section of the sample with visualization of the depth information.
A FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM). However, while the SEM uses a focused beam of electrons to image the sample in the chamber, a FIB setup uses a focused beam of ions instead. FIB can also be incorporated in a system with both electron and ion beam columns, allowing the same feature to be ...
The environmental scanning electron microscope (ESEM) is a scanning electron microscope (SEM) that allows for the option of collecting electron micrographs of specimens that are wet, uncoated, or both by allowing for a gaseous environment in the specimen chamber.
The distance between the probe and a sample is kept at a few nanometers during scanning. Figure 8: General NSOM/FTIR setup. Figure 9 is the cross-section of a NSOM/FTIR instrument. As shown below, sample is placed on a piezo-electric tube scanner, in which the x-y tube has four parts, namely x+, x-, y+ and y-.
The interaction of the electron wave with the crystallographic structure of the sample is complex, but a qualitative idea of the interaction can readily be obtained. Each imaging electron interacts independently with the sample. Above the sample, the wave of an electron can be approximated as a plane wave incident on the sample surface.