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The basic form of a 2-dimensional thin film equation is [3] [4] [5] = where the fluid flux is = [(+ ^) + ^] +, and μ is the viscosity (or dynamic viscosity) of the liquid, h(x,y,t) is film thickness, γ is the interfacial tension between the liquid and the gas phase above it, is the liquid density and the surface shear.
A photograph of a lab-scale slot-die coating tool for thin film materials research. Miniaturized slot-die tools have become increasingly available to support the development of new roll-to-roll compatible processes prior to the requirement of full pilot- and production-scale equipment. These tools feature similar core components and ...
Thickness of the Ge 40 Se 60 /Si film on the silicon substrate as 34.5 nm, Thickness of the Ge 40 Se 60 /Si film on the oxidized silicon substrate as 33.6 nm, Thickness of SiO 2 (with n and k spectra of SiO 2 held fixed), and; n and k spectra, in 190–1000 nm range, of Ge 40 Se 60 /Si.
A thin film is a layer of materials ranging from fractions of a nanometer to several micrometers in thickness. [1] The controlled synthesis of materials as thin films (a process referred to as deposition) is a fundamental step in many applications.
The effects of thin-film interference can also be seen in oil slicks and soap bubbles. The reflectance spectrum of a thin-film features distinct oscillations and the extrema of the spectrum can be used to calculate the thickness of the thin-film. [1] Ellipsometry is a technique that is often used to measure properties of thin films. In a ...
Resistor based on the sheet resistance of carbon film. Sheet resistance is the resistance of a square piece of a thin material with contacts made to two opposite sides of the square. [1] It is usually a measurement of electrical resistance of thin films that are uniform in thickness.
Thus, a fluid film can simultaneously display nanoscale and macroscale phenomena. In the study of the dynamics of free fluid films, such as soap films, it is common to model the film as two dimensional manifolds. Then the variable thickness of the film is captured by the two dimensional density .
Thin-film thickness monitors, deposition rate controllers, and so on, are a family of instruments used in high and ultra-high vacuum systems. They can measure the thickness of a thin film, not only after it has been made, but while it is still being deposited, and some can control either the final thickness of the film, the rate at which it is deposited, or both.