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Particle size analysis, particle size measurement, or simply particle sizing, is the collective name of the technical procedures, or laboratory techniques which determines the size range, and/or the average, or mean size of the particles in a powder or liquid sample.
In 1992, the company was incorporated as Mettler Toledo, Inc. [8] In 1996–97, Mettler Toledo, Inc. was sold by Ciba-Geigy AG to the New York-based AEA Investors Inc., in preparation for a subsequent initial public offering. The initial public offering was completed and began trading on the New York Stock Exchange, under the ticker symbol NYSE ...
This high-technology engineering company was the inventor of the particle size analyzer. Today, it develops, manufactures and produces systems combining laser and precision optics in the field of high technology, accounting. Products for the military represent 50% of turnover against 50% civilian.
The Scherrer equation, in X-ray diffraction and crystallography, is a formula that relates the size of sub-micrometre crystallites in a solid to the broadening of a peak in a diffraction pattern. It is often referred to, incorrectly, as a formula for particle size measurement or analysis. It is named after Paul Scherrer.
Laser diffraction analysis, also known as laser diffraction spectroscopy, is a technology that utilizes diffraction patterns of a laser beam passed through any object ranging from nanometers to millimeters in size [1] to quickly measure geometrical dimensions of a particle. This particle size analysis process does not depend on volumetric flow ...
A sieve analysis (or gradation test) is a practice or procedure used in geology, civil engineering, [1] and chemical engineering [2] to assess the particle size distribution (also called gradation) of a granular material by allowing the material to pass through a series of sieves of progressively smaller mesh size and weighing the amount of material that is stopped by each sieve as a fraction ...
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