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  2. In-circuit testing - Wikipedia

    en.wikipedia.org/wiki/In-circuit_testing

    A common form of in-circuit testing uses a bed-of-nails tester.This is a fixture that uses an array of spring-loaded pins known as "pogo pins". When a printed circuit board is aligned with and pressed down onto the bed-of-nails tester, the pins make electrical contact with locations on the circuit board, allowing them to be used as test points for in-circuit testing.

  3. Solenoid voltmeter - Wikipedia

    en.wikipedia.org/wiki/Solenoid_voltmeter

    When testing power supply circuits, a high-impedance connection (that is, a nearly open-circuit fault such as a burned switch contact or wire joint) in the power path might still allow enough voltage/current through to register on a high-impedance digital voltmeter, but it probably can't actuate the solenoid voltmeter. For use with high ...

  4. Test light - Wikipedia

    en.wikipedia.org/wiki/Test_light

    A test light, test lamp, voltage tester, or mains tester is a piece of electronic test equipment used to determine the presence of electricity in a piece of equipment under test. A test light is simpler and less costly than a measuring instrument such as a multimeter , and often suffices for checking for the presence of voltage on a conductor.

  5. Electronic test equipment - Wikipedia

    en.wikipedia.org/wiki/Electronic_test_equipment

    Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

  6. Bed of nails tester - Wikipedia

    en.wikipedia.org/wiki/Bed_of_nails_tester

    Spring loaded pins are a component of the bed of nails tester. A bed of nails tester is a traditional electronic test fixture used for in-circuit testing.It has numerous pins inserted into holes in an epoxy phenolic glass cloth laminated sheet (G-10) which are aligned using tooling pins to make contact with test points on a printed circuit board and are also connected to a measuring unit by wires.

  7. Built-in self-test - Wikipedia

    en.wikipedia.org/wiki/Built-in_self-test

    Programmable built-in self-test (pBIST) Memory built-in self-test (mBIST) - e.g. with the Marinescu algorithm [2] Logic built-in self-test (LBIST) Analog and mixed-signal built-in self-test (AMBIST) Continuous built-in self-test (CBIST, C-BIT) Event-driven built-in self-test, such as the BIST done to an aircraft's systems after the aircraft lands.

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