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  2. FormFactor, Inc. - Wikipedia

    en.wikipedia.org/wiki/FormFactor,_Inc.

    The company completed an initial public offering (IPO) on the Nasdaq as FORM, [2] in June 2003 with 6 million shares priced at $14. [3] [4] FormFactor released the first x64 DRAM probe card in 2000, [5] followed by the x128 DRAM probe card in 2002. [6] [7] The company shipped the first SmartMatrix full-wafer probe cards in February 2009. [8]

  3. Probe card - Wikipedia

    en.wikipedia.org/wiki/Probe_card

    Use and manufacture. A probe card or DUT board is a printed circuit board (PCB), and is the interface between the integrated circuit and a test head, which in turn attaches to automatic test equipment (ATE) (or "tester"). [2] Typically, the probe card is mechanically docked to a Wafer testing prober and electrically connected to the ATE .

  4. File:COVID-19 Vaccination Record Card CDC (8-17-2020).pdf

    en.wikipedia.org/wiki/File:COVID-19_Vaccination...

    File:COVID-19 Vaccination Record Card CDC (8-17-2020).pdf. Size of this JPG preview of this PDF file: 710 × 599 pixels. Other resolutions: 284 × 240 pixels | 569 × 480 pixels | 725 × 612 pixels. This is a file from the Wikimedia Commons. Information from its description page there is shown below. Commons is a freely licensed media file ...

  5. FormFactor (FORM) Boosts Probe Card Efforts With New Facility

    www.aol.com/news/formfactor-form-boosts-probe...

    FormFactor (FORM) announces the opening of a new probe card manufacturing facility in Livermore, CA, in a bid to bolster its presence in the United States.

  6. Technoprobe - Wikipedia

    en.wikipedia.org/wiki/Technoprobe

    Displaying remarkable ingenuity, Crippa devised a method to manufacture probe cards in his kitchen, circumventing the lengthy repair processes often associated with such components. Over the subsequent 27 years, Technoprobe burgeoned into one of the premier manufacturers of probe cards globally, catering to esteemed clients like Apple, Qualcomm ...

  7. Non-contact wafer testing - Wikipedia

    en.wikipedia.org/wiki/Non-contact_wafer_testing

    the probe card may be damaged from repeated contact, or become contaminated with debris created by contact with the wafer the probe will act as a circuit and affect the results of the test. For this reason, the tests performed at wafer sort cannot always be identical and as extensive as those performed at the final device test after packaging ...

  8. Automatic test equipment - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_equipment

    Automatic test equipment or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the device under test (DUT), equipment under test (EUT) or unit under test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer-controlled digital multimeter, or ...

  9. EPIC (form factor) - Wikipedia

    en.wikipedia.org/wiki/EPIC_(form_factor)

    EPIC (form factor) Embedded Platform for Industrial Computing (EPIC) is a computer form factor, a standard for an industrial-quality single-board computer, in use from about 2004 through 2016.

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