Ad
related to: universal testing machine parts and functionstiniusolsen.com has been visited by 10K+ users in the past month
Search results
Results from the WOW.Com Content Network
Typical lectromechanical Universal Testing Machine Test fixture for three point flex test. A universal testing machine (UTM), also known as a universal tester, [1] universal tensile machine, materials testing machine, materials test frame, is used to test the tensile strength (pulling) and compressive strength (pushing), flexural strength, bending, shear, hardness, and torsion testing ...
Automatic test equipment or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the device under test (DUT), equipment under test (EUT) or unit under test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer-controlled digital multimeter, or ...
Tensile testing, also known as tension testing, [1] is a fundamental materials science and engineering test in which a sample is subjected to a controlled tension until failure. Properties that are directly measured via a tensile test are ultimate tensile strength , breaking strength , maximum elongation and reduction in area. [ 2 ]
Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems. Practical electronics engineering and ...
In physical testing, a fixture is a device or apparatus to hold or support the test specimen during the test. The influence of test fixtures on test results is important and is an ongoing subject of research. [7] Many test methods detail the requirements of test fixtures in the text of the document. [8][9] Test fixture on universal testing ...
Use and manufacture. A probe card or DUT board is a printed circuit board (PCB), and is the interface between the integrated circuit and a test head, which in turn attaches to automatic test equipment (ATE) (or "tester"). [2] Typically, the probe card is mechanically docked to a Wafer testing prober and electrically connected to the ATE .
Creep machines are most commonly used in experiments to determine how efficient and stable a material is. The machine is used by students and companies to create a creep curve on how much pressure and stress a material can handle. The machine is able to calculate the stress rate, time and pressure. [citation needed] Creep testing has three ...
Built-in test equipment includes multimeters, oscilloscopes, discharge probes, and frequency generators that are provided as part of the system to enable testing and perform diagnostics. The acronym BIT is often used for this same function or, more specifically, in reference to the individual tests. BIT often includes: The detection of the fault
Ad
related to: universal testing machine parts and functionstiniusolsen.com has been visited by 10K+ users in the past month