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The atomic X-ray absorption spectrum (XAS) of a core-level in an absorbing atom is separated into states in the discrete part of the spectrum called "bounds final states" or "Rydberg states" below the ionization potential (IP) and "states in the continuum" part of the spectrum above the ionization potential due to excitations of the photoelectron in the vacuum.
Wavelength-dispersive X-ray spectroscopy (WDXS or WDS) is a non-destructive analysis technique used to obtain elemental information about a range of materials by measuring characteristic x-rays within a small wavelength range. The technique generates a spectrum in which the peaks correspond to specific x-ray lines and elements can be easily ...
There exist several efficient designs for analyzing an X-ray emission spectrum in the ultra soft X-ray region. The figure of merit for such instruments is the spectral throughput, i.e. the product of detected intensity and spectral resolving power. Usually, it is possible to change these parameters within a certain range while keeping their ...
X-ray emission spectroscopy (XES) is a form of X-ray spectroscopy in which a core electron is excited by an incident X-ray photon and then this excited state decays by emitting an X-ray photon to fill the core hole. The energy of the emitted photon is the energy difference between the involved electronic levels.
Energy-dispersive X-ray spectroscopy (EDS, EDX, EDXS or XEDS), sometimes called energy dispersive X-ray analysis (EDXA or EDAX) or energy dispersive X-ray microanalysis (EDXMA), is an analytical technique used for the elemental analysis or chemical characterization of a sample. It relies on an interaction of some source of X-ray excitation and ...
Maps of North America (1 C, 4 P, 2 F) S. Maps of South America (1 C, 1 P) Pages in category "Maps of the Americas" This category contains only the following page.
X-ray diffraction topography is one variant of X-ray imaging, making use of diffraction contrast rather than absorption contrast which is usually used in radiography and computed tomography (CT). Topography is exploited to a lesser extent with neutrons , and is the same concept as dark field imaging in an electron microscope .
Particle-Induced X-Ray Emission or Proton-Induced X-Ray Emission (PIXE) is a technique used for determining the elemental composition of a material or a sample.When a material is exposed to an ion beam, atomic interactions occur that give off EM radiation of wavelengths in the x-ray part of the electromagnetic spectrum specific to an element.