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Rutherford backscattering spectrometry (RBS) is an analytical technique used in materials science.Sometimes referred to as high-energy ion scattering (HEIS) spectrometry, RBS is used to determine the structure and composition of materials by measuring the backscattering of a beam of high energy ions (typically protons or alpha particles) impinging on a sample.
Image of a Kratos Axis-165 system equipped with XPS, ISS, and AES, from Alberta Centre for Surface Engineering and Science (ACSES). Low-energy ion scattering spectroscopy (LEIS), sometimes referred to simply as ion scattering spectroscopy (ISS), is a surface-sensitive analytical technique used to characterize the chemical and structural makeup of materials.
Rutherford scattering or Coulomb scattering is the elastic scattering of charged particles by the Coulomb interaction. The paper also initiated the development of the planetary Rutherford model of the atom and eventually the Bohr model. Rutherford scattering is now exploited by the materials science community in an analytical technique called ...
Rutherford backscattering (RBS) reactions are elastic (Q = 0), and the interaction (scattering) cross-section σ given by the famous formula derived by Lord Rutherford in 1911. But non -Rutherford cross-sections (so-called EBS , elastic backscattering spectrometry ) can also be resonant: for example, the 16 O(α,α) 16 O reaction has a strong ...
Backscatter. In physics, backscatter (or backscattering) is the reflection of waves, particles, or signals back to the direction from which they came. It is usually a diffuse reflection due to scattering, as opposed to specular reflection as from a mirror, although specular backscattering can occur at normal incidence with a surface.
Elastic recoil detection. Appearance. hide. Elastic recoil detection analysis (ERDA), also referred to as forward recoil scattering or spectrometry, is an ion beam analysis technique in materials science to obtain elemental concentration depth profiles in thin films. [ 1 ] This technique can be achieved using many processes.
Ion beam analysis (IBA) is an important family of modern analytical techniques involving the use of MeV ion beams to probe the composition and obtain elemental depth profiles in the near-surface layer of solids. IBA is not restricted to MeV energy ranges. It can be operated at low energy (<Kev) using techniques such as FIB, and Secondary ion ...
In Rutherford backscattering spectroscopy, the correction due to electron screening modifies the Coulomb repulsion between the incident ion and the target nucleus at large distances. It is the repulsion effect caused by the inner electron on the outer electron.