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  2. Logic probe - Wikipedia

    en.wikipedia.org/wiki/Logic_probe

    A control on the logic probe allows either the capture and storage of a single event or continuous running. When the logic probe is either connected to an invalid logic level (a fault condition or a tri-stated output) or not connected at all, none of the LEDs light up. Another control on the logic probe allow selection of either TTL or CMOS ...

  3. Electronic test equipment - Wikipedia

    en.wikipedia.org/wiki/Electronic_test_equipment

    Multimeter e.g., VOM (Volt-Ohm-Milliammeter) or DMM (Digital Multimeter) (Measures all of the above) LCR meter - inductance (L), capacitance (C) and resistance (R) meter (measure LCR values) The following are used for stimulus of the circuit under test: Power supplies; Signal generator; Digital pattern generator; Pulse generator

  4. Multimeter - Wikipedia

    en.wikipedia.org/wiki/Multimeter

    Analog multimeter Digital multimeter. A multimeter (also known as a volt-ohm-milliammeter, volt-ohmmeter or VOM) [1] is a measuring instrument that can measure multiple electrical properties. [2] [3] A typical multimeter can measure voltage, resistance, and current, [4] in which case can be used as a voltmeter, ohmmeter, and ammeter.

  5. Test probe - Wikipedia

    en.wikipedia.org/wiki/Test_probe

    A test probe is a physical device used to connect electronic test equipment to a device under test (DUT). Test probes range from very simple, robust devices to complex probes that are sophisticated, expensive, and fragile. Specific types include test prods, oscilloscope probes and current probes.

  6. Automatic test equipment - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_equipment

    An ATE can be a simple computer-controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on wafer testing, including system on chips and integrated circuits.

  7. Built-in test equipment - Wikipedia

    en.wikipedia.org/wiki/Built-In_Test_Equipment

    Built-in test equipment includes multimeters, oscilloscopes, discharge probes, and frequency generators that are provided as part of the system to enable testing and perform diagnostics. The acronym BIT is often used for this same function or, more specifically, in reference to the individual tests. BIT often includes: The detection of the fault

  8. Logic analyzer - Wikipedia

    en.wikipedia.org/wiki/Logic_analyzer

    Logic analyzer. A logic analyzer is an electronic instrument that captures and displays multiple logic signals from a digital system or digital circuit. A logic analyzer may convert the captured data into timing diagrams, protocol decodes, state machine traces, opcodes, or may correlate opcodes with source-level software. Logic analyzers have ...

  9. Category:Electronic test equipment - Wikipedia

    en.wikipedia.org/wiki/Category:Electronic_test...

    Capacitance meter; CDMA mobile test set; Chip-scale atomic clock; Circuit breaker analyzer; Class of accuracy in electrical measurements; Comb generator; Continuity tester; Coulombmeter; Cryogenic current comparator; Current clamp; Current transformer; Curve tracer

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