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Formfactor, Inc. is a provider of test and measurement technologies for integrated circuits, with its headquarters in Livermore, California. It provides semiconductor companies with products to improve device performance and provide test and measurement technologies for integrated circuits.
As a trusted supplier, FormFactor provides SK hynix with advanced wafer probe cards for high-bandwidth memory (HBM) testing, high-throughput one-touchdown DRAM testing, and engineering probe systems designed for extreme environments, all of which play a key role in supporting the development of next-generation semiconductor devices.
Probe cards are broadly classified into needle type, vertical type, and MEMS (Micro Electro-Mechanical System) [4] type depending on shape and forms of contact elements. MEMS type is the most advanced technology currently available. The most advanced type of probe card currently can test an entire 12" wafer with one touchdown.
FormFactor (FORM) announces the opening of a new probe card manufacturing facility in Livermore, CA, in a bid to bolster its presence in the United States.
Full integration of FormFactor’s Velox™ probe station control and wafer-level measurement with Advantest’s V93000 test system. Wafer-level low-loss edge and surface coupling for photonic devices, with single-click automated calibration using FormFactor’s OptoVue™ and OptoVue™ Pro, enabling the fastest tool setup time.
The company announced it was sold to FormFactor, Inc. in February 2016 for $352 million, with the deal closing in June 2016. [29] [30] In 2017, Cascade Microtech, together with Imec, developed a fully-automatic system to pre-bond test advanced 3D chips. The two companies won the 2017 National Instruments Engineering Impact Award in the ...
Probes are published on the Portal along with a highlight of the probe’s validation data, and it takes a few weeks for the SAB ratings (denoted with 0 to 4 stars) to emerge. Probe pages also contain SAB comments and links to related databases or sources (e.g., journals) where additional information can be found. Probes must receive an average ...
A test probe is a physical device used to connect electronic test equipment to a device under test (DUT). Test probes range from very simple, robust devices to complex probes that are sophisticated, expensive, and fragile. Specific types include test prods, oscilloscope probes and current probes.