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Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope , an instrument for imaging surfaces at the atomic level.
Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). [ 1 ] [ 2 ] [ 3 ] By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features.
The technique of vibrational analysis with scanning probe microscopy allows probing vibrational properties of materials at the submicrometer scale, and even of individual molecules. [ 1 ] [ 2 ] [ 3 ] This is accomplished by integrating scanning probe microscopy (SPM) and vibrational spectroscopy ( Raman scattering or/and Fourier transform ...
This is a sub-diffraction technique. Examples of scanning probe microscopes are the atomic force microscope (AFM), the scanning tunneling microscope, the photonic force microscope and the recurrence tracking microscope. All such methods use the physical contact of a solid probe tip to scan the surface of an object, which is supposed to be ...
Scanning Hall probe microscope (SHPM) is a variety of a scanning probe microscope which incorporates accurate sample approach and positioning of the scanning tunnelling microscope with a semiconductor Hall sensor. Developed in 1996 by Oral, Bending and Henini, [2] SHPM allows mapping the magnetic induction associated with a sample.
Tip-enhanced Raman spectroscopy (TERS) is a variant of surface-enhanced Raman spectroscopy (SERS) [1] that combines scanning probe microscopy with Raman spectroscopy. High spatial resolution chemical imaging is possible via TERS, [2] with routine demonstrations of nanometer spatial resolution under ambient laboratory conditions, [3] or better [4] at ultralow temperatures and high pressure.
Scanning vibrating electrode technique was originally introduced to sensitively measure extracellular currents by Jaffe and Nuccitelli in 1974. [1] Jaffe and Nuccitelli then demonstrated the ability of the technique through the measurement of the extracellular currents involved with amputated and re-generating newt limbs, [5] developmental currents of chick embryos, [6] and the electrical ...
Scanning ion-conductance microscopy diagram. Scanning ion-conductance microscopy (SICM) is a scanning probe microscopy technique that uses an electrode as the probe tip. [1] SICM allows for the determination of the surface topography of micrometer and even nanometer-range [2] structures in aqueous media conducting electrolytes. The samples can ...