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  2. Automatic test equipment - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_equipment

    Automatic test equipment diagnostics is the part of an ATE test that determines the faulty components. ATE tests perform two basic functions. The first is to test whether or not the Device Under Test is working correctly. The second is when the DUT is not working correctly, to diagnose the reason.

  3. Automatic test pattern generation - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_pattern...

    ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.

  4. Automatic test switching - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_switching

    Automatic test system switching test equipment allows for high-speed testing of a device or devices in a test situation, where strict sequences and combinations of switching must be observed. By automating the process in this way, the possibility of test errors and inaccuracies is minimized, and only systematic errors would generally be ...

  5. Automated optical inspection - Wikipedia

    en.wikipedia.org/wiki/Automated_optical_inspection

    An Automated Optical Inspection device. Automated optical inspection (AOI) is an automated visual inspection of printed circuit board (PCB) (or LCD, transistor) manufacture where a camera autonomously scans the device under test for both catastrophic failure (e.g. missing component) and quality defects (e.g. fillet size or shape or component skew).

  6. Probe card - Wikipedia

    en.wikipedia.org/wiki/Probe_card

    A probe card or DUT board is a printed circuit board (PCB), and is the interface between the integrated circuit and a test head, which in turn attaches to automatic test equipment (ATE) (or "tester"). [2] Typically, the probe card is mechanically docked to a Wafer testing prober and electrically connected to the ATE . Its purpose is to provide ...

  7. Electronic test equipment - Wikipedia

    en.wikipedia.org/wiki/Electronic_test_equipment

    Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

  8. AOL Mail for Verizon Customers - AOL Help

    help.aol.com/products/aol-mail-verizon

    AOL Mail welcomes Verizon customers to our safe and delightful email experience!

  9. Test fixture - Wikipedia

    en.wikipedia.org/wiki/Test_fixture

    In testing electronic equipment such as circuit boards, electronic components, and chips, a test fixture is a device or setup designed to hold the device under test in place and allow it to be tested by being subjected to controlled electronic test signals. [1]

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