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An atomic force microscope on the left with controlling computer on the right. Atomic force microscopy [1] (AFM) is a type of SPM, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by "feeling" or "touching" the surface with a ...
Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms ) to the surface under study, the probe is then raster scanned across the surface, the image is then ...
Topographic (left) and current (right) maps collected with CAFM on a polycrystalline HfO 2 stack. The images show very good spatial correlation. In microscopy, conductive atomic force microscopy (C-AFM) or current sensing atomic force microscopy (CS-AFM) is a mode in atomic force microscopy (AFM) that simultaneously measures the topography of a material and the electric current flow at the ...
Atomic force microscope inside a FTIR spectrometer with the optical interface. The earliest measurements combining AFM with infrared spectroscopy were performed in 1999 by Hammiche et al. at the University of Lancaster in the United Kingdom, [1] in an EPSRC-funded project led by M Reading and H M Pollock.
In a bimodal AM-FM configuration, two feedback loops act on the 2nd mode. One keeps A 2 {\displaystyle A_{2}} fixed while a phase-lock loop keeps ϕ 2 = 90 o {\displaystyle \phi _{2}=90^{o}} . Bimodal Atomic Force Microscopy (bimodal AFM) is an advanced atomic force microscopy technique characterized by generating high-spatial resolution maps ...
Scheme of the colloidal probe technique for direct force measurements in the sphere-plane and sphere-sphere geometries. The colloidal probe technique is commonly used to measure interaction forces acting between colloidal particles and/or planar surfaces in air or in solution. This technique relies on the use of an atomic force microscope (AFM).
Electrostatic force microscopy (EFM) is a type of dynamic non-contact atomic force microscopy where the electrostatic force is probed. ("Dynamic" here means that the cantilever is oscillating and does not make contact with the sample). This force arises due to the attraction or repulsion of separated charges.
Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). [ 1 ] [ 2 ] [ 3 ] By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features.