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  2. Electronic test equipment - Wikipedia

    en.wikipedia.org/wiki/Electronic_test_equipment

    Multimeter e.g., VOM (Volt-Ohm-Milliammeter) or DMM (Digital Multimeter) (Measures all of the above) LCR meter - inductance (L), capacitance (C) and resistance (R) meter (measure LCR values) The following are used for stimulus of the circuit under test: Power supplies; Signal generator; Digital pattern generator; Pulse generator

  3. Multimeter - Wikipedia

    en.wikipedia.org/wiki/Multimeter

    Analog multimeter Digital multimeter. A multimeter (also known as a volt-ohm-milliammeter, volt-ohmmeter or VOM) [1] is a measuring instrument that can measure multiple electrical properties. [2] [3] A typical multimeter can measure voltage, resistance, and current, [4] in which case can be used as a voltmeter, ohmmeter, and ammeter.

  4. Continuity tester - Wikipedia

    en.wikipedia.org/wiki/Continuity_tester

    Entry-level cable testers are essentially continuity testers. A continuity tester is an item of electrical test equipment used to determine if an electrical path can be established between two points; [1] that is if an electrical circuit can be made. The circuit under test is completely de-energized prior to connecting the apparatus. [1]

  5. Continuity test - Wikipedia

    en.wikipedia.org/wiki/Continuity_test

    In electronics, a continuity test is the checking of an electric circuit to see if current flows (that it is in fact a complete circuit). A continuity test is performed by placing a small voltage (wired in series with an LED or noise-producing component such as a piezoelectric speaker ) across the chosen path.

  6. Automatic test equipment - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_equipment

    An ATE can be a simple computer-controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on wafer testing, including system on chips and integrated circuits.

  7. Breakout box - Wikipedia

    en.wikipedia.org/wiki/Breakout_box

    T1000-37 Tesuto Breakout box employing commonly used 37 position D-sub connectors that break out to banana jack test points. A four-port serial (RS-232) PCI Express ×1 expansion card with an octopus cable that breaks the card's DC-37 connector into four standard DE-9 connectors Example of a pocket-sized RS-232 breakout box that features switches to reconfigure or patch any or all the active ...

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  9. Electrical isolation test - Wikipedia

    en.wikipedia.org/wiki/Electrical_isolation_test

    The test often reveals problems that occurred during assembly, such as defective components, improper component placement, and insulator defects that may cause inadvertent shorting or grounding to chassis, in turn, compromising electrical circuit quality and product safety.

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