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  2. Safe operating area - Wikipedia

    en.wikipedia.org/wiki/Safe_operating_area

    For power semiconductor devices (such as BJT, MOSFET, thyristor or IGBT), the safe operating area (SOA) is defined as the voltage and current conditions over which the device can be expected to operate without self-damage. [1] Illustration of safe operating area of a bipolar power transistor.

  3. List of semiconductor scale examples - Wikipedia

    en.wikipedia.org/wiki/List_of_semiconductor...

    Listed are many semiconductor scale examples for various metal–oxide–semiconductor field-effect transistor (MOSFET, or MOS transistor) semiconductor manufacturing process nodes. Timeline of MOSFET demonstrations

  4. Worst-case circuit analysis - Wikipedia

    en.wikipedia.org/wiki/Worst-case_circuit_analysis

    Generate a formal report to convey the information produced; The design is broken down into the appropriate functional sections. A mathematical model of the circuit is developed and the effects of various part/system tolerances are applied. The circuit's EVA and RSS results are determined for beginning-of-life and end-of-life states.

  5. Failure mode and effects analysis - Wikipedia

    en.wikipedia.org/wiki/Failure_mode_and_effects...

    graph with an example of steps in a failure mode and effects analysis. Failure mode and effects analysis (FMEA; often written with "failure modes" in plural) is the process of reviewing as many components, assemblies, and subsystems as possible to identify potential failure modes in a system and their causes and effects. For each component, the ...

  6. International Technology Roadmap for Semiconductors - Wikipedia

    en.wikipedia.org/wiki/International_Technology...

    For several years, the Semiconductor Industry Association (SIA) gave this responsibility of coordination to the United States, which led to the creation of an American style roadmap, the National Technology Roadmap for Semiconductors (NTRS). [5] The first semiconductor roadmap, published by the SIA in 1993.

  7. High-temperature operating life - Wikipedia

    en.wikipedia.org/wiki/High-temperature_operating...

    High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test stresses the IC at an elevated temperature, high voltage and dynamic operation for a predefined period of time.

  8. Layout Versus Schematic - Wikipedia

    en.wikipedia.org/wiki/Layout_Versus_Schematic

    The need for such programs was recognized relatively early in the history of ICs, and programs to perform this comparison were written as early as 1975. [1] These early programs operated mainly on the level of graph isomorphism, checking whether the schematic and layout were indeed identical. With the advent of digital logic, this was too ...

  9. Open Artwork System Interchange Standard - Wikipedia

    en.wikipedia.org/wiki/Open_Artwork_System...

    Open Artwork System Interchange Standard (OASIS [3]) is a binary file format used for specification of data structures for photomask production. [4] It's used to represent a pattern an interchange and encapsulation format for hierarchical integrated circuit mask layout information produced during integrated circuit design that is further used for manufacturing of a photomask.