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  2. Topaz (1969 film) - Wikipedia

    en.wikipedia.org/wiki/Topaz_(1969_film)

    Topaz is a 1969 American espionage thriller film directed by Alfred Hitchcock, and starring Frederick Stafford, Dany Robin, Karin Dor, John Vernon, Claude Jade, Michel Subor, Michel Piccoli, Philippe Noiret and John Forsythe.

  3. In-circuit testing - Wikipedia

    en.wikipedia.org/wiki/In-circuit_testing

    A common form of in-circuit testing uses a bed-of-nails tester.This is a fixture that uses an array of spring-loaded pins known as "pogo pins". When a printed circuit board is aligned with and pressed down onto the bed-of-nails tester, the pins make electrical contact with locations on the circuit board, allowing them to be used as test points for in-circuit testing.

  4. Topaz (disambiguation) - Wikipedia

    en.wikipedia.org/wiki/Topaz_(disambiguation)

    Topaz, a cryptonym for Rainer Rupp (b. 1945), spy for East Germany who worked at NATO headquarters in Brussels William Topaz McGonagall (1825-1902), a Scottish poet. Topaz Winters (b. 1999) Pen name of poet Priyanka Aiyer

  5. Bed of nails tester - Wikipedia

    en.wikipedia.org/wiki/Bed_of_nails_tester

    Spring loaded pins are a component of the bed of nails tester. A bed of nails tester is a traditional electronic test fixture used for in-circuit testing.It has pins inserted into holes in an epoxy phenolic glass cloth laminated sheet (G-10) which are aligned using tooling pins to make contact with test points on a printed circuit board and are also connected to a measuring unit by wires.

  6. TEST KITCHEN is a place where pigment, pixels, paint and prototypes collide. Where we believe that the best stories are made up of messes, mashups, m issteps + mistakes. We want to fan the flames of promiscuous curiosity t hrough experimentation, investigation, observation, and o dditie s.

  7. Non-contact wafer testing - Wikipedia

    en.wikipedia.org/wiki/Non-contact_wafer_testing

    the probe will act as a circuit and affect the results of the test. For this reason, the tests performed at wafer sort cannot always be identical and as extensive as those performed at the final device test after packaging is complete [3] since the probe pads are typically on the perimeter of the IC, the IC can soon become pad-limited.

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    The HGTV star paired her designer bustier with a pair of Yves Saint Laurent black leather boots

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