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  2. X-ray diffraction - Wikipedia

    en.wikipedia.org/wiki/X-ray_diffraction

    X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering , when there is no change in the energy of the waves.

  3. Difference density map - Wikipedia

    en.wikipedia.org/wiki/Difference_density_map

    Difference density maps are usually calculated using Fourier coefficients which are the differences between the observed structure factor amplitudes from the X-ray diffraction experiment and the calculated structure factor amplitudes from the current model, using the phase from the model for both terms (since no phases are available for the ...

  4. Extended X-ray absorption fine structure - Wikipedia

    en.wikipedia.org/wiki/Extended_X-ray_absorption...

    XAS is an interdisciplinary technique and its unique properties, as compared to x-ray diffraction, have been exploited for understanding the details of local structure in: glass, amorphous and liquid systems; solid solutions; doping and ionic implantation of materials for electronics; local distortions of crystal lattices; organometallic compounds

  5. X-ray crystallography - Wikipedia

    en.wikipedia.org/wiki/X-ray_crystallography

    An X-ray diffraction pattern of a crystallized enzyme. The pattern of spots (reflections) and the relative strength of each spot (intensities) can be used to determine the structure of the enzyme. The relative intensities of the reflections provides information to determine the arrangement of molecules within the crystal in atomic detail.

  6. Rietveld refinement - Wikipedia

    en.wikipedia.org/wiki/Rietveld_refinement

    Rietveld refinement is a technique described by Hugo Rietveld for use in the characterisation of crystalline materials. The neutron and X-ray diffraction of powder samples results in a pattern characterised by reflections (peaks in intensity) at certain positions.

  7. Wide-angle X-ray scattering - Wikipedia

    en.wikipedia.org/wiki/Wide-angle_X-ray_scattering

    X-ray diffraction is a non destructive method of characterization of solid materials. When X-rays are directed at solids they scatter in predictable patterns based on the internal structure of the solid. A crystalline solid consists of regularly spaced atoms (electrons) that can be described by imaginary planes.

  8. Small-angle X-ray scattering - Wikipedia

    en.wikipedia.org/wiki/Small-angle_X-ray_scattering

    Small-angle X-ray scattering (SAXS) is a small-angle scattering technique by which nanoscale density differences in a sample can be quantified. This means that it can determine nanoparticle size distributions, resolve the size and shape of (monodisperse) macromolecules, determine pore sizes and characteristic distances of partially ordered materials. [1]

  9. Patterson function - Wikipedia

    en.wikipedia.org/wiki/Patterson_function

    The peaks' positions in the Patterson function are the interatomic distance vectors and the peak heights are proportional to the product of the number of electrons in the atoms concerned. Because for each vector between atoms i and j there is an oppositely oriented vector of the same length (between atoms j and i ), the Patterson function ...