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  2. Iddq testing - Wikipedia

    en.wikipedia.org/wiki/Iddq_testing

    Iddq testing has many advantages: It is a simple and direct test that can identify physical defects. The area and design time overhead are very low. Test generation is fast. Test application time is fast since the vector sets are small. It catches some defects that other tests, particularly stuck-at logic tests, do not.

  3. Deep-level transient spectroscopy - Wikipedia

    en.wikipedia.org/wiki/Deep-level_transient...

    The most commonly used are Schottky diodes or p-n junctions. In the measurement process the steady-state diode reverse polarization voltage is disturbed by a voltage pulse . This voltage pulse reduces the electric field in the space charge region and allows free carriers from the semiconductor bulk to penetrate this region and recharge the ...

  4. Current–voltage characteristic - Wikipedia

    en.wikipedia.org/wiki/Current–voltage...

    Tunnel diodes and Gunn diodes are examples of components that have negative resistance. Hysteresis vs single-valued: Devices which have hysteresis; that is, in which the current–voltage relation depends not only on the present applied input but also on the past history of inputs, have I–V curves consisting of families of closed loops. Each ...

  5. In-circuit testing - Wikipedia

    en.wikipedia.org/wiki/In-circuit_testing

    While in-circuit test is a very powerful tool for testing PCBs, it has these limitations: Parallel components can often only be tested as one component if the components are of the same type (i.e. two resistors); though different components in parallel may be testable using a sequence of different tests - e.g. a DC voltage measurement versus a measurement of AC injection current at a node.

  6. Diode logic - Wikipedia

    en.wikipedia.org/wiki/Diode_logic

    Diode logic (or diode-resistor logic) constructs AND and OR logic gates with diodes and resistors. An active device ( vacuum tubes with control grids in early electronic computers , then transistors in diode–transistor logic ) is additionally required to provide logical inversion (NOT) for functional completeness and amplification for voltage ...

  7. Continuity test - Wikipedia

    en.wikipedia.org/wiki/Continuity_test

    In electronics, a continuity test is the checking of an electric circuit to see if current flows (that it is in fact a complete circuit). A continuity test is performed by placing a small voltage (wired in series with an LED or noise-producing component such as a piezoelectric speaker ) across the chosen path.

  8. Safe operating area - Wikipedia

    en.wikipedia.org/wiki/Safe_operating_area

    The safe operating area curve is a graphical representation of the power handling capability of the device under various conditions. The SOA curve takes into account the wire bond current carrying capability, transistor junction temperature, internal power dissipation and secondary breakdown limitations.

  9. Semiconductor characterization techniques - Wikipedia

    en.wikipedia.org/wiki/Semiconductor...

    Semiconductor characterization techniques are used to characterize a semiconductor material or device (p–n junction, Schottky diode, solar cell, etc.).Some examples of semiconductor properties that could be characterized include the depletion width, carrier concentration, carrier generation and recombination rates, carrier lifetimes, defect concentration, and trap states.