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2. Scanning electron microscope - Wikipedia

   en.wikipedia.org/wiki/Scanning_electron_microscope

   An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...

3. Scanning transmission electron microscopy - Wikipedia

   en.wikipedia.org/wiki/Scanning_transmission...

   A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused ...

4. Environmental scanning electron microscope - Wikipedia

   en.wikipedia.org/wiki/Environmental_scanning...

   The environmental scanning electron microscope (ESEM) is a scanning electron ... Other competing manufacturers have used the terms "Natural SEM" [75] (Hitachi), ...

5. Serial block-face scanning electron microscopy - Wikipedia

   en.wikipedia.org/wiki/Serial_block-face_scanning...

   Serial block-face scanning electron microscopy is a method to generate high resolution three-dimensional images from small samples. The technique was developed for brain tissue, but it is widely applicable for any biological samples. [ 1 ]

6. Everhart–Thornley detector - Wikipedia

   en.wikipedia.org/wiki/Everhart–Thornley_detector

   In the light pipe the photons travel outside of the microscope's vacuum chamber to a photomultiplier tube for amplification. The E-T secondary electron detector can be used in the SEM's back-scattered electron mode by either turning off the Faraday cage or by applying a negative voltage to the Faraday cage.

7. Electron-beam technology - Wikipedia

   en.wikipedia.org/wiki/Electron-beam_technology

   An electron microscope uses a controlled beam of electrons to illuminate a specimen and produce a magnified image. Two common types are the scanning electron microscope (SEM) and the transmission electron microscope (TEM).