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There exist several efficient designs for analyzing an X-ray emission spectrum in the ultra soft X-ray region. The figure of merit for such instruments is the spectral throughput, i.e. the product of detected intensity and spectral resolving power. Usually, it is possible to change these parameters within a certain range while keeping their ...
Energy-dispersive X-ray spectroscopy (EDS, EDX, EDXS or XEDS), sometimes called energy dispersive X-ray analysis (EDXA or EDAX) or energy dispersive X-ray microanalysis (EDXMA), is an analytical technique used for the elemental analysis or chemical characterization of a sample. It relies on an interaction of some source of X-ray excitation and ...
Wavelength-dispersive X-ray spectroscopy (WDXS or WDS) is a non-destructive analysis technique used to obtain elemental information about a range of materials by measuring characteristic x-rays within a small wavelength range. The technique generates a spectrum in which the peaks correspond to specific x-ray lines and elements can be easily ...
The analysis of the energy dependence of the emitted photons is the aim of the X-ray emission spectroscopy. [ 1 ] [ 2 ] [ 3 ] XES is also sometimes referred to as X-ray Fluorescence (XRF) spectroscopy, and while the terms can be used interchangeably, XES more often describes high energy resolution techniques [ 4 ] while XRF studies a wider ...
The continuous and discrete spectra of physical systems can be modeled in functional analysis as different parts in the decomposition of the spectrum of a linear operator acting on a function space, such as the Hamiltonian operator. The classical example of a discrete spectrum (for which the term was first used) is the characteristic set of ...
Small-angle X-ray scattering (SAXS) is a small-angle scattering technique by which nanoscale density differences in a sample can be quantified. This means that it can determine nanoparticle size distributions, resolve the size and shape of (monodisperse) macromolecules, determine pore sizes and characteristic distances of partially ordered materials. [1]
The discrete spectrum is defined as the set of normal eigenvalues or, equivalently, as the set of isolated points of the spectrum such that the corresponding Riesz projector is of finite rank. As such, the discrete spectrum is a strict subset of the point spectrum, i.e., σ d ( T ) ⊂ σ p ( T ) . {\displaystyle \sigma _{d}(T)\subset \sigma ...
X-ray reflectivity is an analytical technique for determining thickness, roughness, and density of single layer and multilayer thin films. Wide-angle X-ray scattering (WAXS), a technique concentrating on scattering angles 2θ larger than 5°. Spectrum of various inelastic scattering processes that can be probed with inelastic X-ray scattering ...