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  2. Focused ion beam - Wikipedia

    en.wikipedia.org/wiki/Focused_ion_beam

    A FIB workstation. Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. A FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM).

  3. Electron beam-induced deposition - Wikipedia

    en.wikipedia.org/wiki/Electron_beam-induced...

    Only SEM-like imaging using secondary electrons is possible, and even that imaging is restricted to short observations due to sample damaging by the Ga + beam. The use of a dual beam instrument, that combines a FIB and an SEM in one, circumvents this limitation. The advantages of IBID are: Much higher deposition rate; Higher purity

  4. Serial block-face scanning electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Serial_block-face_scanning...

    A serial block-face scanning electron microscope consists of an ultramicrotome mounted inside the vacuum chamber of a scanning electron microscope. Samples are prepared by methods similar to that in transmission electron microscopy ( TEM ), typically by fixing the sample with aldehyde, staining with heavy metals such as osmium and uranium then ...

  5. Scanning transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_transmission...

    A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen.

  6. TESCAN - Wikipedia

    en.wikipedia.org/wiki/TESCAN

    TESCAN originally manufactured programmable controllers, digitizers for older analog scanning electron microscopes, and other small accessories. In 2020, 3000 was installed at the University of Freiburg, Germany. [4] TESCAN has now produced over 3,000 SEMs and FIB-SEMs. [citation needed]

  7. Electron backscatter diffraction - Wikipedia

    en.wikipedia.org/wiki/Electron_backscatter...

    Electron backscatter diffraction (EBSD) is a scanning electron microscopy (SEM) technique used to study the crystallographic structure of materials. EBSD is carried out in a scanning electron microscope equipped with an EBSD detector comprising at least a phosphorescent screen, a compact lens and a low-light camera. In the microscope an ...

  8. 4D scanning transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/4D_scanning_transmission...

    4D scanning transmission electron microscopy (4D STEM) is a subset of scanning transmission electron microscopy (STEM) which utilizes a pixelated electron detector to capture a convergent beam electron diffraction (CBED) pattern at each scan location. This technique captures a 2 dimensional reciprocal space image associated with each scan point ...

  9. Self-expandable metallic stent - Wikipedia

    en.wikipedia.org/wiki/Self-expandable_metallic_stent

    Self-expandable metallic stents are cylindrical in shape, and are devised in a number of diameters and lengths to suit the application in question. [1] They typically consist of cross-hatched, braided or interconnecting rows of metal that are assembled into a tube-like structure.

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